The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||3||2.0 - 4.0|
|Mean Width /µm||28||20 - 35|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||2.8||0.5 - 9.5|
|Resonance Frequency /kHz||75||45 - 115|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-FMAuD-10||10||of all probes||Au (detector side)|