The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.
NANOSENSORS™ PPP-CONTAu probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.
Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.
|Property||Nominal Value||Specified Range|
|Thickness /µm||2||1.0 - 3.0|
|Mean Width /µm||50||42.5 - 57.5|
|Length /µm||450||440 - 460|
|Force Constant /(N/m)||0.2||0.02 - 0.77|
|Resonance Frequency /kHz||13||6 - 21|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-CONTAu-10||10||of all probes||Au (detector side)|