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PPP-MFMR

Point Probe® Plus Magnetic Force Microscopy - Reflex Coating

The NANOSENSORS™ PPP-MFMR AFM probe is our standard probe for magnetic force microscopy providing a reasonable sensitivity, resolution and coercitivity. It has proven stable imaging of a variety of recording media and other samples. The force constant of this probe type is specially tailored for magnetic force microscopy yielding high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

The hard magnetic coating on the tip is optimized for high magnetic contrast and high lateral resolution of considerably better than 50 nm. The coating is characterized by a coercivity of app. 300 Oe and a remanence magnetization of app. 300 emu/cm3 (these values were determined on a flat surface).

The SPM probe offers unique features:

As both coatings are almost stress free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PPP-MFMR-10 10 of all probes hard magnetic and reflex
PPP-MFMR-20 20 of all probes hard magnetic and reflex
PPP-MFMR-50 50 without hard magnetic and reflex
PPP-MFMR-W > 380 of up to 32 probes hard magnetic and reflex


Product screencast NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes

Please watch the new product screencast on NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes at http://youtu.be/qssFxoZ8ELY.
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