The NANOSENSORS™ PPP-MFMR AFM probe is our standard probe for magnetic force microscopy providing a reasonable sensitivity, resolution and coercitivity. It has proven stable imaging of a variety of recording media and other samples. The force constant of this probe type is specially tailored for magnetic force microscopy yielding high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
The hard magnetic coating on the tip is optimized for high magnetic contrast and high lateral resolution of considerably better than 50 nm. The coating is characterized by a coercivity of app. 300 Oe and a remanence magnetization of app. 300 emu/cm3 (these values were determined on a flat surface).
As both coatings are almost stress free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.
|Property||Nominal Value||Specified Range|
|Thickness /µm||3||2.0 - 4.0|
|Mean Width /µm||28||20 - 35|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||2.8||0.5 - 9.5|
|Resonance Frequency /kHz||75||45 - 115|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-MFMR-10||10||of all probes||hard magnetic and reflex|
|PPP-MFMR-20||20||of all probes||hard magnetic and reflex|
|PPP-MFMR-50||50||without||hard magnetic and reflex|
|PPP-MFMR-W||> 380||of up to 32 probes||hard magnetic and reflex|