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PPP-LM-MFMR

Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating

The NANOSENSORS™ PPP-LM-MFMR AFM probe is designed for magnetic force microscopy with reduced disturbance of the magnetic sample by the tip and enhanced lateral resolution - compared to the standard PPP-MFMR probe. The force constant of this probe type is specially tailored for magnetic force microscopy yielding high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

The hard magnetic coating on the tip is characterized by a coercivity of app. 250 Oe and a remanence magnetization of app. 150 emu/cm3 (these values were determined on a flat surface).

The SPM probe offers unique features:

As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

Cantilever data:

Property Nominal Value Specified Range
Resonance Frequency /kHz 75 45 - 115
Force Constant /(N/m) 2.8 0.5 - 9.5
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PPP-LM-MFMR-10 10 of all probes hard magnetic and reflex
PPP-LM-MFMR-20 20 of all probes hard magnetic and reflex
PPP-LM-MFMR-50 50 without hard magnetic and reflex


Product screencast NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes

Please watch the new product screencast on NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes at http://youtu.be/qssFxoZ8ELY.
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NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG