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Platinum Silicide Probes Force Modulation Mode

NANOSENSORS™ PtSi-FM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-FM probes are suitable for C-AFM, Tunneling AFM, Scanning Capacitance Microscopy (SCM), Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KFPM).

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:


Cantilever data:

Property Nominal Value Specified Range
Resonance Frequency /kHz 75 45 - 115
Force Constant /(N/m) 2.8 0.5 - 9.5
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PtSi-FM-10 10 of all probes PtSi (reflective)
PtSi-FM-20 20 of all probes PtSi (reflective)
PtSi-FM-50 50 without PtSi (reflective)

Product Screencast NANOSENSORS™ Platinum Silicide AFM Probes

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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / /

NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG