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FLAT

Flatness standard

The flatness standard consists of a superflat plane and is intended to be used to analyze and correct the scanner bow of the piezo-scanner used in most Scanning Force Microscopes. The standard consists of a quartz substrate with a chromium layer.

Features:

This standard has been developed in close cooperation with the German national authority of standards: PTB (Physikalisch Technische Bundesanstalt). Due to this PTB is able to certify this standard in accordance with international guidelines. Please contact Working Group 5.25 Scanning Probe Metrology at www.ptb.de directly.

 




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