NANOSENSORS™ DT-CONTR probes are designed for contact mode (repulsive mode) AFM imaging. The CONT type is optimized for high sensitivity due to a low force constant.
For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The DT Diamond Coating is an approximately 100 nm thick coating of polycrystalline diamond on the tip-side of the cantilever leading to an unsurpassed hardness of the tip. The raman spectrum of the coating verifies the real diamond coating.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||2||1.0 - 3.0|
|Mean Width /µm||50||42.5 - 57.5|
|Length /µm||450||440 - 460|
|Force Constant /(N/m)||0.5||0.1 - 1.7|
|Resonance Frequency /kHz||20||11 - 29|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|DT-CONTR-10||10||of all probes||diamond and reflex|
|DT-CONTR-20||20||of all probes||diamond and reflex|
|DT-CONTR-50||50||without||diamond and reflex|
Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus Silicon AFM Probes by Jörg Diebel.