AdvancedTEC™ Cont

Advanced Tip at the End of the Cantilever™ Contact Mode

NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:: - real tip visibility from top; - tip length 15 - 20 µm; - typical tip radius of curvature better than 10 nm; - monolithic silicon; - highly doped to dissipate static charge; - chemically inert; - high mechanical Q-factor for high sensitivity

Cantilever data:

Technical Data	Nominal Value	Specified Range
Thickness /µm	2	1.0 - 3.0
Width /µm	50	45 - 55
Length /µm	450	440 - 460
Force Constant /(N/m)	0.2	0.02 - 0.75
Resonance Frequency /kHz	15	7 - 25

Order codes and shipping units:

Order Code	Quantity
ATEC-CONT-10	10
ATEC-CONT-20	20
ATEC-CONT-50	50

Please also refer to the special handling information for the AdvancedTEC™ probe provided by NANOSENSORS™.

For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com