{"id":5273,"date":"2026-04-09T16:30:04","date_gmt":"2026-04-09T13:30:04","guid":{"rendered":"https:\/\/www.nanosensors.com\/blog\/?p=5273"},"modified":"2026-07-09T12:02:54","modified_gmt":"2026-07-09T09:02:54","slug":"ferroelectric-phase-transitions-in-srtio%e2%82%83-thin-films","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/ferroelectric-phase-transitions-in-srtio%e2%82%83-thin-films\/","title":{"rendered":"Ferroelectric Phase Transitions in SrTiO\u2083 Thin Films"},"content":{"rendered":"

Understanding ferroelectric and structural phase transitions in oxide materials is essential for the development of next-generation electronic and photonic devices. In this article, Ludmila Leroy et al. investigate antiferrodistortive and ferroelectric phase transitions in freestanding SrTiO\u2083 thinfilms.<\/p>\n

Using piezoresponse force microscopy (PFM), polarization dynamics were analyzed at cryogenic temperatures, revealing the relationship between structural transitions and ferroelectric behavior.<\/p>\n

PFM hysteresis measurements were performed using a NANOSENSORS Platinum Silicide<\/a> PtSi-FM<\/a> AFM probe with a spring constant of 2.8 N\/m. The AFM probe was operated in contact-resonance mode, enabling sensitive detection of electromechanical coupling and polarization switching.<\/p>\n

These results demonstrate how NANOSENSORS AFM probes support high-resolution PFM measurements and contribute to the understanding of ferroelectric thinfilms.<\/p>\n

\"\"<\/a><\/p>\n

 <\/p>\n

Full citation:
\n<\/strong>Leroy, L.; Huang, S.-W.; Chiu, C.-C.; Ho, S.-Z.; D\u00f6ssegger, J.; Piamonteze, C.; Chen, Y.-C.; Abreu, E.; Bombardi, A.; Yang, J.-C.; Staub, U.
\nAntiferrodistortive and Ferroelectric Phase Transitions in Freestanding Films of SrTiO\u2083.
\n<\/strong>Nano Letters 2025, 25(19), 7651\u20137657.
\n<\/strong>https:\/\/doi.org\/10.1021\/acs.nanolett.4c05664<\/a><\/p>\n

\u00a0<\/strong><\/p>\n

The article \u201cAntiferrodistortive and Ferroelectric Phase Transitions in Freestanding Films of SrTiO<\/em>\u201d\u00a0 is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article\u2019s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article\u2019s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https:\/\/creativecommons.org\/licenses\/by\/4.0\/.<\/p>\n","protected":false},"excerpt":{"rendered":"

Understanding ferroelectric and structural phase transitions in oxide materials is essential for the development of next-generation electronic and photonic devices. In this article, Ludmila Leroy et al. investigate antiferrodistortive and ferroelectric phase transitions in freestanding SrTiO\u2083 thinfilms. Using piezoresponse force microscopy (PFM), polarization dynamics were analyzed at cryogenic temperatures, revealing the relationship between structural transitions… Read More »Ferroelectric Phase Transitions in SrTiO\u2083 Thin Films<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":5274,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"off","neve_meta_content_width":70,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[8,16],"tags":[82,17,18,448,339,398,19,1236,306,187,77,64,63,220,1221,442,400],"class_list":{"0":"post-5273","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","6":"hentry","7":"category-nanosensors-news","8":"category-science-technology","9":"tag-afm-cantilever","10":"tag-afm-probes","11":"tag-afm-tips","12":"tag-afm","15":"tag-atomic-force-microscopy","16":"tag-ferroelectric-thinfilms","17":"tag-ferroelectricity","18":"tag-ferroelectrics","19":"tag-nanosensors","20":"tag-pfm","21":"tag-piezoresponse-force-microscopy","22":"tag-ptsi-fm","23":"tag-thinfilms","24":"tag-442","25":"tag-400"},"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/5273","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=5273"}],"version-history":[{"count":6,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/5273\/revisions"}],"predecessor-version":[{"id":5306,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/5273\/revisions\/5306"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/5274"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=5273"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=5273"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=5273"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}