{"id":4446,"date":"2021-01-22T18:24:36","date_gmt":"2021-01-22T16:24:36","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/in%e2%80%90situ-force-measurement-during-nano%e2%80%90indentation-combined-with-laue-microdiffraction\/"},"modified":"2023-03-15T14:49:57","modified_gmt":"2023-03-15T12:49:57","slug":"in%e2%80%90situ-force-measurement-during-nano%e2%80%90indentation-combined-with-laue-microdiffraction","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/in%e2%80%90situ-force-measurement-during-nano%e2%80%90indentation-combined-with-laue-microdiffraction\/","title":{"rendered":"In\u2010situ force measurement during nano\u2010indentation combined with Laue microdiffraction"},"content":{"rendered":"\n

A NANOSENSORS\u2122 self-sensing self-activating Akiyama prob<\/a>e was used in a home-built Scanning Probe Microscope for this interesting research article.<\/p>\n\n\n\n

*Florian Lauraux, Sarah Yehya, St\u00e9phane Labat, Jean\u2010S\u00e9bastien Micha, Odile Robach, Oleg Kovalenko, Eugen Rabkin, Olivier Thomas, Thomas W. Cornelius
In\u2010situ force measurement during nano\u2010indentation combined with Laue microdiffraction<\/strong>
Nano Select , Volume2, Issue1, January 2021, Pages 99-106
DOI: https:\/\/doi.org\/10.1002\/nano.202000073<\/a><\/p>\n\n\n\n

\"NANOSENSORS<\/a>
NANOSENSORS self-sensing and self-actuating Akiyama-probe<\/figcaption><\/figure>\n\n\n\n

Please have a look at the abstract below or follow the external link above to read the full article.<\/p>\n\n\n\n

Abstract:<\/p>\n\n\n\n

\u201cFor the characterization of the mechanical properties of materials the precise measurements of stress\u2010strain curves is indispensable. In situ nano\u2010mechanical testing setups, however, may lack the precision either in terms of strain or stress determination. Recently, the custom\u2010built scanning force microscope SFINX was developed which is compatible with third\u2010generation synchrotron end\u2010stations allowing for in situ nano\u2010mechanical tests in combination with nanofocused synchrotron x\u2010ray diffraction that is highly sensitive to strain and defects. The usage of a self\u2010actuating and self\u2010sensing cantilever tremendously increases the compactness of the system but lacks deflection sensitivity and, thus the force measurement. This deficiency is resolved by in situ monitoring the diffraction peaks of the Si cantilever by Laue microdiffraction during the nano\u2010indentation of a gold crystal. The orientation and, hence, the deflection of the Si cantilever is deduced from the displacement of the Si Laue spots on the detector giving force accuracies of better than 90 nN. At the same time, the dislocation density in the indented Au crystal is tracked by monitoring the Au Laue spots eventually resulting in complete stress\u2010dislocation density curves.\u201d* <\/p>\n\n\n\n

Open Access: The article \u201cIn\u2010situ force measurement during nano\u2010indentation combined with Laue microdiffraction<\/em>\u201d by Florian Lauraux, Sarah Yehya, St\u00e9phane Labat, Jean\u2010S\u00e9bastien Micha, Odile Robach, Oleg Kovalenko, Eugen Rabkin, Olivier Thomas, Thomas W. Cornelius is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article\u2019s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article\u2019s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http:\/\/creativecommons.org\/licenses\/by\/4.0\/.<\/p>\n","protected":false},"excerpt":{"rendered":"

A NANOSENSORS\u2122 self-sensing self-activating Akiyama probe was used in a home-built Scanning Probe Microscope for this interesting research article. *Florian Lauraux, Sarah Yehya, St\u00e9phane Labat, Jean\u2010S\u00e9bastien Micha, Odile Robach, Oleg Kovalenko, Eugen Rabkin, Olivier Thomas, Thomas W. CorneliusIn\u2010situ force measurement during nano\u2010indentation combined with Laue microdiffractionNano Select , Volume2, Issue1, January 2021, Pages 99-106DOI: https:\/\/doi.org\/10.1002\/nano.202000073… Read More »In\u2010situ force measurement during nano\u2010indentation combined with Laue microdiffraction<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":4341,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[16],"tags":[131,82,17,18,448,339,398,26,19,573,569,570,571,572,574,360,361,567,60,102,568,442,400],"class_list":{"0":"post-4446","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","6":"hentry","7":"category-science-technology","8":"tag-a-probe","9":"tag-afm-cantilever","10":"tag-afm-probes","11":"tag-afm-tips","12":"tag-afm","15":"tag-akiyama-probe","16":"tag-atomic-force-microscopy","17":"tag-characterization","18":"tag-characterization-of-the-mechanical-properties-of-materials","19":"tag-force-measurement","20":"tag-in-situ-nanoindentation","21":"tag-laue-microdiffraction","22":"tag-materials-properties","23":"tag-materials-research","24":"tag-materials-science","25":"tag-nanomechanical-tests","26":"tag-scanning-probe-microscopy","27":"tag-self-sensing-self-actuating-afm-probe","28":"tag-stressstrain-curves","29":"tag-442","30":"tag-400"},"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4446","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=4446"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4446\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/4341"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=4446"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=4446"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=4446"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}