{"id":4363,"date":"2020-01-19T23:00:39","date_gmt":"2020-01-19T21:00:39","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/kelvin-probe-force-microscopy-work-function-characterization-of-transition-metal-oxide-crystals-under-ongoing-reduction-and-oxidation\/"},"modified":"2023-03-15T14:51:36","modified_gmt":"2023-03-15T12:51:36","slug":"kelvin-probe-force-microscopy-work-function-characterization-of-transition-metal-oxide-crystals-under-ongoing-reduction-and-oxidation","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/kelvin-probe-force-microscopy-work-function-characterization-of-transition-metal-oxide-crystals-under-ongoing-reduction-and-oxidation\/","title":{"rendered":"Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation"},"content":{"rendered":"\n

Controlling the work function of transition\nmetal oxides is of key importance with regard to future energy production and\nstorage. As the majority of applications involve the use of heterostructures,\nthe most suitable characterization technique is Kelvin probe force microscopy\n(KPFM), which provides excellent energetic and lateral resolution.*<\/p>\n\n\n\n

In their study \u201cKelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation<\/em>\u00bb Dominik Wrana, Karol Cie\u015blik, Wojciech Belza, Christian Rodenb\u00fccher, Krzysztof Szot and Franciszek Krok present the advantages and limitations of the FM-KPFM technique using the example of a newly discovered TiO\/SrTiO3(100) (metal\/insulator) heterostructure, which has potentially high technological relevance.*

In the same article a combined conductivity and work function study from the same surface area is presented, showing the possibility of obtaining full information on the electronic properties when the KPFM technique is accompanied by local conductivity atomic force microscopy (LC-AFM).*<\/p>\n\n\n\n

The authos present the measurement of the crystalline TiO work function and its dependence on the gaseous pressure of air using Kelvin probe force microscopy. <\/p>\n\n\n\n

In order to ensure reproducible FM-KPFM results, two different types of AFM cantilevers were used: NANOSENSORS\u2122 PointProbe\u00ae Plus<\/a> PPP-ContPt (PtIr-coated<\/a>) and NANOSENSORS\u2122 Platinum Silicide<\/a> PtSi-FM<\/a>.*<\/p>\n\n\n\n

Such cantilevers are widely used as conducting tips in a contact mode AFM, allowing for a high lateral resolution in conductivity measurements. The remarkable mechanical stability of the selected cantilevers allowed for the noncontact mode measurements (with a Kelvin loop) using the very same tip, maintaining oscillations at the higher harmonics of the fundamental frequency (\u224875 kHz). Hence, in order to record current and CPD maps from the very same sample area, KPFM measurements were first performed with the soft cantilever forced to oscillate at higher harmonics, then the tip was retracted tens of nanometers from the surface, all feedback loops were turned down and a contact mode AFM scan was performed when approached with a single loop maintaining a deflection set point of 10\u201330 mV. The high conductivity of both TiO and STO materials enabled a low sample bias of +1 mV for the LC-AFM measurements to be used.*<\/p>\n\n\n\n

\"\"
Figure 4 from \u201cKelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation<\/em>\u201d: KPFM lateral resolution on high TiO\/STO structures. a) Topography and b) work function of TiO nanowire array on SrTiO3(100). c) Height (black line) and work function (green line) profiles of two adjacent TiO nanowires, showing high KPFM contrast. d) Dependence of the CPD resolution (estimated as \u0394CPD\/CPD, see c) on the separation between TiO nanowires, with A + B\/X asymptote fit. Insets show the SEM images of the actual PtSi cantilever used in the experiments with a tip radius of 15 nm. <\/figcaption><\/figure>\n\n\n\n

*Dominik\nWrana, Karol Cie\u015blik, Wojciech Belza, Christian Rodenb\u00fccher, Krzysztof Szot,\nFranciszek Krok
\nKelvin probe force microscopy work function characterization of transition\nmetal oxide crystals under ongoing reduction and oxidation<\/strong>
\nBeilstein Journal of Nanotechnology 2019, 10, 1596\u20131607
\nDOI: 10.3762\/bjnano.10.155<\/p>\n\n\n\n

Please follow this external link to read the full article: https:\/\/www.beilstein-journals.org\/bjnano\/articles\/10\/155<\/a><\/p>\n\n\n\n

Open Access\nThe article \u201cKelvin probe force microscopy work function characterization of\ntransition metal oxide crystals under ongoing reduction and oxidation<\/em>\u201d by\nDominik Wrana, Karol Cie\u015blik, Wojciech Belza, Christian Rodenb\u00fccher, Krzysztof\nSzot and Franciszek Krok is licensed under a Creative Commons Attribution 4.0\nInternational License, which permits use, sharing, adaptation, distribution and\nreproduction in any medium or format, as long as you give appropriate credit to\nthe original author(s) and the source, provide a link to the Creative Commons\nlicense, and indicate if changes were made. The images or other third party\nmaterial in this article are included in the article\u2019s Creative Commons\nlicense, unless indicated otherwise in a credit line to the material. If\nmaterial is not included in the article\u2019s Creative Commons license and your\nintended use is not permitted by statutory regulation or exceeds the permitted\nuse, you will need to obtain permission directly from the copyright holder. To\nview a copy of this license, visit http:\/\/creativecommons.org\/licenses\/by\/4.0\/.<\/p>\n","protected":false},"excerpt":{"rendered":"

Controlling the work function of transition metal oxides is of key importance with regard to future energy production and storage. As the majority of applications involve the use of heterostructures, the most suitable characterization technique is Kelvin probe force microscopy (KPFM), which provides excellent energetic and lateral resolution.* In their study \u201cKelvin probe force microscopy… Read More »Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":4366,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[16],"tags":[17,18,137,339,398,19,186,117,313,407,118,408,23,49,405,404,25,236,56,44,406,220,409,144,60,401,410,411,412,413,414],"class_list":{"0":"post-4363","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","6":"hentry","7":"category-science-technology","8":"tag-afm-probes","9":"tag-afm-tips","10":"tag-afmprobes","11":"tag-afm","13":"tag-atomic-force-microscopy","14":"tag-conductive-afm-probes","15":"tag-contact-mode","16":"tag-contact-mode-afm-probes","17":"tag-fm-kpfm","18":"tag-force-modulation-mode","19":"tag-frequency-modulation-kelvin-probe-force-microscopy","20":"tag-kelvin-probe-force-microscopy-kpfm","21":"tag-kpfm","22":"tag-lc-afm","23":"tag-local-conductivity-atomic-force-microscopy","24":"tag-nanosensors-platinum-silicide","25":"tag-platinum-iridum-coated-pointprobe-plus","26":"tag-platinum-silicide","27":"tag-platinum-silicide-afm-probes","28":"tag-ppp-contpt","29":"tag-ptsi-fm","30":"tag-reduction-and-oxidation","31":"tag-scanning-kelvin-probe-microscopy","32":"tag-scanning-probe-microscopy","33":"tag-skpm","34":"tag-srtio3","35":"tag-tio-nanowires","36":"tag-tio-srtio3-heterostructure","37":"tag-transition-metal-oxides","38":"tag-work-function"},"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4363","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=4363"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4363\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/4366"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=4363"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=4363"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=4363"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}