{"id":4312,"date":"2019-09-04T23:30:52","date_gmt":"2019-09-04T20:30:52","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/visit-us-at-jasis-2019-this-week\/"},"modified":"2023-03-15T14:51:40","modified_gmt":"2023-03-15T12:51:40","slug":"visit-us-at-jasis-2019-this-week","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/visit-us-at-jasis-2019-this-week\/","title":{"rendered":"Visit us at JASIS 2019 this week"},"content":{"rendered":"\n<p>Don\u2019t forget to visit us @<a href=\"http:\/\/www.nanoandmore.jp\" target=\"_blank\" rel=\"noreferrer noopener\" aria-label=\"NanoAndMore Japan (opens in a new tab)\">NanoAndMore Japan<\/a> booth 6A-402 in hall 6 at <a rel=\"noreferrer noopener\" aria-label=\"#JASIS2019 (opens in a new tab)\" href=\"https:\/\/www.jasis.jp\/en\/\" target=\"_blank\">#JASIS2019<\/a> this week and let them explain with their fancy new #AFMtip models which #AFMprobe among the many options we offer is best for your #AtomicForceMicroscopy and #ScanningProbeMicroscopy application. We are looking forward to seeing you!<\/p>\n\n\n\n<figure class=\"wp-block-image\"><img decoding=\"async\" src=\"https:\/\/nanosensors.com\/blog\/wp-content\/uploads\/2022\/11\/NANOSENSORS-AFM-probes-at-NanoAndMore-Japan-booth-at-JASIS2019-have-a-look-at-AFM-tip-models-1024x858-2.jpg\" alt=\"\" class=\"wp-image-2008\"\/><figcaption>Many different AFM tip models at the NanoAndMore Japan booth at JASIS 2019 this week<\/figcaption><\/figure>\n","protected":false},"excerpt":{"rendered":"<p>Don\u2019t forget to visit us @NanoAndMore Japan booth 6A-402 in hall 6 at #JASIS2019 this week and let them explain with their fancy new #AFMtip models which #AFMprobe among the many options we offer is best for your #AtomicForceMicroscopy and #ScanningProbeMicroscopy application. We are looking forward to seeing you!<\/p>\n","protected":false},"author":2,"featured_media":4315,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[8],"tags":[82,17,18,339,19,60,108,109,107,340,341,342],"class_list":["post-4312","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-nanosensors-news","tag-afm-cantilever","tag-afm-probes","tag-afm-tips","tag-afm","tag-atomic-force-microscopy","tag-scanning-probe-microscopy","tag-spm-cantilevers","tag-spm-probes","tag-spm-tips","tag-spm","tag-341","tag-342"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4312","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=4312"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4312\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/4315"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=4312"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=4312"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=4312"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}