![\"](\"https:\/\/nanosensors.com\/blog\/wp-content\/uploads\/2022\/11\/Fig.-2-from-Conductive-probe-atomic-force-microscopy-and-Kelvin-probe-force-microscopy-characterization-of-OH-terminated-diamond-111-surfaces-with-step-terrace-structures_smo-2.jpg\")
Fig. 2 from \u201cConductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures\u201d by Masatsugu Nagai et al.:
(Color online) (a) The topographic image and CPD map of the OH-terminated diamond (111) surface with ST and BS regions. (b) the cross sectional image and CPD profile corresponding to the line A-A’ in the Fig. 2(a). <\/figcaption><\/figure>\n\n\n\n
*Masatsugu Nagai<\/a>, Ryo Yoshida, Tatsuki Yamada, Taira Tabakoya, Christoph E. Nebel, Satoshi Yamasaki, Toshiharu Makino, Tsubasa Matsumoto, Takao Inokuma and Norio Tokuda Please follow this external link for the full article: https:\/\/iopscience.iop.org\/article\/10.7567\/1347-4065\/ab1b5c<\/a><\/p>\n\n\n\n Open Access: The article \u201cConductive-probe\natomic force microscopy and Kelvin-probe force microscopy characterization of\nOH-terminated diamond (111) surfaces with step-terrace structures\u201d by Masatsugu\nNagai, Ryo Yoshida, Tatsuki Yamada, Taira Tabakoya, Christoph E. Nebel, Satoshi\nYamasaki, Toshiharu Makino, Tsubasa Matsumoto, Takao Inokuma and Norio Tokuda is\nlicensed under a Creative Commons Attribution 4.0 International License, which\npermits use, sharing, adaptation, distribution and reproduction in any medium\nor format, as long as you give appropriate credit to the original author(s) and\nthe source, provide a link to the Creative Commons license, and indicate if\nchanges were made. The images or other third party material in this article are\nincluded in the article\u2019s Creative Commons license, unless indicated otherwise\nin a credit line to the material. If material is not included in the article\u2019s\nCreative Commons license and your intended use is not permitted by statutory\nregulation or exceeds the permitted use, you will need to obtain permission\ndirectly from the copyright holder. To view a copy of this license, visit\nhttp:\/\/creativecommons.org\/licenses\/by\/4.0\/<\/p>\n","protected":false},"excerpt":{"rendered":" Diamond has a high breakdown field, high carrier mobilities and the highest thermal conductivity. That is why diamond is a promising material for next generation high-power devices such as field effect transistors.* In their paper \u201cConductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures\u201d, Masatsugu Nagai, Ryo… Read More »Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":4302,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[16],"tags":[17,19,321,186,322,58,23,49,25,56,44,55,60,109,237],"class_list":["post-4301","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-science-technology","tag-afm-probes","tag-atomic-force-microscopy","tag-charcterization","tag-conductive-afm-probes","tag-diamond","tag-kelvin-force-probe-microscopy","tag-kelvin-probe-force-microscopy-kpfm","tag-kpfm","tag-nanosensors-platinum-silicide","tag-platinum-silicide","tag-platinum-silicide-afm-probes","tag-ptsi","tag-scanning-probe-microscopy","tag-spm-probes","tag-wear-resistant-afm-probes"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4301","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=4301"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4301\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/4302"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=4301"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=4301"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=4301"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures<\/strong>
Japanese Journal of Applied Physics, 2019, Volume 58, Number SIIB08
DOI: https:\/\/doi.org\/10.7567\/1347-4065\/ab1b5c<\/p>\n\n\n\n