{"id":4281,"date":"2019-07-02T15:06:01","date_gmt":"2019-07-02T12:06:01","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/meet-our-ceo-at-nano-korea-this-week\/"},"modified":"2023-03-15T14:51:43","modified_gmt":"2023-03-15T12:51:43","slug":"meet-our-ceo-at-nano-korea-this-week","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/meet-our-ceo-at-nano-korea-this-week\/","title":{"rendered":"Meet our CEO at Nano Korea this week"},"content":{"rendered":"\n<p>Are you visiting the Nano Korea 2019 at KINTEX Korea this week? If yes you might meet our CEO who is also in attendance and is always ready to discuss new applications for our AFM probes.<\/p>\n\n\n\n<figure class=\"wp-block-image\"><img decoding=\"async\" src=\"https:\/\/nanosensors.com\/blog\/wp-content\/uploads\/2022\/11\/meet-our-CEO-at-Nano-Korea-2019_social_media_optimized-1024x768-2.jpg\" alt=\"\" class=\"wp-image-1903\"\/><figcaption>Have you already spotted him walking through the exhibition hall? Our CEO Manfred Detterbeck visits Nano Korea 2019 this week.<\/figcaption><\/figure>\n\n\n\n<p><br><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Are you visiting the Nano Korea 2019 at KINTEX Korea this week? If yes you might meet our CEO who is also in attendance and is always ready to discuss new applications for our AFM probes.<\/p>\n","protected":false},"author":2,"featured_media":4284,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[8],"tags":[82,17,18,19,60,108,109],"class_list":["post-4281","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-nanosensors-news","tag-afm-cantilever","tag-afm-probes","tag-afm-tips","tag-atomic-force-microscopy","tag-scanning-probe-microscopy","tag-spm-cantilevers","tag-spm-probes"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4281","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=4281"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4281\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/4284"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=4281"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=4281"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=4281"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}