{"id":4182,"date":"2018-08-30T10:09:38","date_gmt":"2018-08-30T07:09:38","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/domain-wall-motion-in-pbzr0-20ti0-80o3-epitaxial-thin-films\/"},"modified":"2023-03-15T14:53:14","modified_gmt":"2023-03-15T12:53:14","slug":"domain-wall-motion-in-pbzr0-20ti0-80o3-epitaxial-thin-films","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/domain-wall-motion-in-pbzr0-20ti0-80o3-epitaxial-thin-films\/","title":{"rendered":"Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films"},"content":{"rendered":"<p>A NANOSENSORS AdvancedTEC <a href=\"https:\/\/www.nanosensors.com\/Advanced-Tip-at-the-End-of-the-Cantilever-Force-Modulation-Mode-Pt-Ir-coated-afm-tip-ATEC-EFM\">ATEC-EFM<\/a> PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al <a href=\"https:\/\/rdcu.be\/5qTo\"><em>Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films <\/em><\/a>published in Nature Communications.<\/p>\n<div id=\"attachment_1568\" style=\"width: 820px\" class=\"wp-caption alignleft\"><a href=\"https:\/\/nanosensors.com\/blog\/wp-content\/uploads\/2022\/11\/Figure-1-from-Borderon-et-al-Domain-wall-motion-in-PbZr0.20Ti0.80O3-epitaxial-thin-films-2.jpg\"><img loading=\"lazy\" decoding=\"async\" aria-describedby=\"caption-attachment-1568\" class=\"size-full wp-image-1568\" src=\"https:\/\/nanosensors.com\/blog\/wp-content\/uploads\/2022\/11\/Figure-1-from-Borderon-et-al-Domain-wall-motion-in-PbZr0.20Ti0.80O3-epitaxial-thin-films-2.jpg\" alt=\"Figure 1 from Borderon et al. Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films: Piezoelectric Force Microscopy (PFM) characterization of the epitaxial PZT thin films. The scan size is 2 \u03bcm\u00d71 \u03bcm for the c-domain ample and 1 \u03bcm \u00d7 0.5 \u03bcm for the a\/c-domain sample. PFM characterization done with ATEC-EFM AFM probe\" width=\"810\" height=\"961\" data-wp-pid=\"1568\" \/><\/a><p id=\"caption-attachment-1568\" class=\"wp-caption-text\">Figure 1 from Borderon et.al <a href=\"https:\/\/rdcu.be\/5qTo\">Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films<\/a>: <em>Piezoelectric Force Microscopy (PFM) characterization of the epitaxial PZT thin films. The scan size is 2 \u03bcm\u00d71<\/em><br \/><em>\u03bcm for the c-domain ample and 1 \u03bcm \u00d7 0.5 \u03bcm for the a\/c-domain sample.<\/em><\/p><\/div>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>C. Borderon, A. E. Brunier, K. Nadaud, R. Renoud, M. Alexe, H. W. Gundel<br \/>\n<a href=\"https:\/\/www.nature.com\/articles\/s41598-017-03757-y.epdf?shared_access_token=Nlm1bjEiar5-oUMU1Q3gwtRgN0jAjWel9jnR3ZoTv0Po5J57H1u1L89DMj2Np3IMQBs6Ea76cL8ETB5movAjsJCJuvrpBUcjv6rsFZRQP_O97nFDBxJOkTMn901uRjFHZsrSd0dpL7UUviaDFcjc5oDBhm-S8cvCGV3huWGoqHY%3D\"><strong>Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films<\/strong><\/a><br \/>\nNature Scientific Reports, volume 7, Article number: 3444 (2017)<br \/>\ndoi: <a href=\"https:\/\/doi.org\/10.1038\/s41598-017-03757-y\">https:\/\/doi.org\/10.1038\/s41598-017-03757-y<\/a><\/p>\n<p>To read the full article please follow this external link: <a href=\"https:\/\/rdcu.be\/5qTo\">https:\/\/rdcu.be\/5qTo<\/a><\/p>\n<p><span class=\"current-selection\">Open Access:\u00a0<\/span> <span class=\"current-selection\">The article\u00a0 <a href=\"https:\/\/rdcu.be\/5qTo\"><em>Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films\u00a0 <\/em><\/a>by Borderon et.al is licensed under a Creative Commons Attribution 4.0 International <\/span><span class=\"current-selection\">License, which permits use, sharing,\u00a0 adaptation, distribution and reproduction in any medium or <\/span><span class=\"current-selection\">format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Cre<\/span><span class=\"current-selection\">ative Commons license, and indicate if changes were made. The images or other third party material in this <\/span><span class=\"current-selection\">article are included in the article\u2019s Creative Commons license, unless indicated otherwise in a credit line to the <\/span><span class=\"current-selection\">material. If material is not included in the article\u2019s Creative Commons license and your intended use is not per<\/span><span class=\"current-selection\">mitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the <\/span><span class=\"current-selection\">copyright holder. To view a copy of this license, visit <\/span> <a href=\"http:\/\/creativecommons.org\/licenses\/by\/4.0\/\"><span class=\"current-selection\">http:\/\/creativecommons.org\/licenses\/by\/4.0\/<\/span><\/a><\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<pre><\/pre>\n","protected":false},"excerpt":{"rendered":"<p>A NANOSENSORS AdvancedTEC ATEC-EFM PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films published in Nature Communications. &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; C. Borderon, A. E. Brunier,&hellip;&nbsp;<a href=\"https:\/\/www.nanosensors.com\/blog\/domain-wall-motion-in-pbzr0-20ti0-80o3-epitaxial-thin-films\/\" class=\"\" rel=\"bookmark\">Read More &raquo;<span class=\"screen-reader-text\">Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":4183,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[16],"tags":[30,17,18,184,19,186,48,187,188,64,185,63,60],"class_list":["post-4182","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-science-technology","tag-advancedtec","tag-afm-probes","tag-afm-tips","tag-atec-efm","tag-atomic-force-microscopy","tag-conductive-afm-probes","tag-efm","tag-ferroelectrics","tag-multiferroics","tag-pfm","tag-piezo-force-microscopy","tag-piezoresponse-force-microscopy","tag-scanning-probe-microscopy"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4182","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=4182"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4182\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/4183"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=4182"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=4182"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=4182"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}