{"id":4061,"date":"2017-06-19T07:54:29","date_gmt":"2017-06-19T04:54:29","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/direct-imaging-of-defect-formation-in-strained-organic-flexible-electronics-by-scanning-kelvin-probe-microscopy\/"},"modified":"2023-03-15T14:53:21","modified_gmt":"2023-03-15T12:53:21","slug":"direct-imaging-of-defect-formation-in-strained-organic-flexible-electronics-by-scanning-kelvin-probe-microscopy","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/direct-imaging-of-defect-formation-in-strained-organic-flexible-electronics-by-scanning-kelvin-probe-microscopy\/","title":{"rendered":"Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy"},"content":{"rendered":"

NANOSENSORS PPP-NCSTAu probes <\/a>were used for scanning probe characterizations for this publication.<\/p>\n

\"Figure<\/a>

Figure 1: OTFT structure and setup for force microscopy on bent substrates. From: T. Cramer et. al., Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy<\/a><\/p><\/div>\n

Cramer, T. et al<\/i>. Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy. Sci. Rep.<\/i> 6<\/b>, 38203; doi: 10.1038\/srep38203 (2016).<\/a><\/p>\n

For the full article have a look at:
\nhttps:\/\/www.nature.com\/articles\/srep38203
\n<\/a><\/p>\n

\n
<\/div>\n<\/section>\n

\"Creative<\/a>The article “Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy”\u00a0 by Tobias Cramer et. al. is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http:\/\/creativecommons.org\/licenses\/by\/4.0\/<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy. Sci. Rep. 6, 38203; doi: 10.1038\/srep38203 (2016). For the full article have a look at: https:\/\/www.nature.com\/articles\/srep38203 The article “Direct imaging of Defect Formation in… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":4062,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[16],"tags":[82,17,18,19,186,206,129,58,23,49,27,146,144,60,76],"class_list":["post-4061","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-science-technology","tag-afm-cantilever","tag-afm-probes","tag-afm-tips","tag-atomic-force-microscopy","tag-conductive-afm-probes","tag-electronic-properties-and-materials","tag-gold-coated-pointprobe-plus-afm-tips","tag-kelvin-force-probe-microscopy","tag-kelvin-probe-force-microscopy-kpfm","tag-kpfm","tag-pointprobe-plus-ppp","tag-ppp-ncstau","tag-scanning-kelvin-probe-microscopy","tag-scanning-probe-microscopy","tag-spm"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4061","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=4061"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/4061\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/4062"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=4061"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=4061"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=4061"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}