{"id":3937,"date":"2015-10-04T23:00:35","date_gmt":"2015-10-04T20:00:35","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/nanosensors-ultrastiff-afm-probes-for-atomic-resolution\/"},"modified":"2023-03-15T14:54:21","modified_gmt":"2023-03-15T12:54:21","slug":"nanosensors-ultrastiff-afm-probes-for-atomic-resolution","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/nanosensors-ultrastiff-afm-probes-for-atomic-resolution\/","title":{"rendered":"NANOSENSORS\u2122 Ultrastiff AFM Probes for Atomic Resolution"},"content":{"rendered":"<p>Dr. Oliver Krause, product developer at NANOSENSORS\u2122 is talking in this screencast about AFM probes for dynamic AFM with sub-nanometer amplitudes enabling imaging with atomic and sub-nanometer resolution<\/p>\n<div class=\"nv-iframe-embed\"><iframe loading=\"lazy\" title=\"NANOSENSORS\u2122 Ultrastiff AFM Probes for Atomic Resolution\" width=\"1200\" height=\"675\" src=\"https:\/\/www.youtube.com\/embed\/WUThrm0B_KY?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" allowfullscreen><\/iframe><\/div>\n<p>Dynamic AFM with extremely small oscillation amplitudes of the probing tip enables Atomic Force Microscopy with atomic and even sub-atomic resolution. By adjusting the oscillation amplitude to the regime of short-range forces the impact of long-range forces on the detection mechanism can be suppressed effectively.<br \/>\nFor stable operation the bending forces of the cantilever must be able to overcome the attractive tip-sample forces. Dynamic AFM with sub-nanometre amplitudes requires cantilevers with a force constant larger than 300N\/m. The force constants of typical AFM probes for intermittent contact (Tapping Mode) are in the order of a few tens of N\/m. Therefore, amplitudes of at least a few nanometres are required for stable operation.<br \/>\nUltrastiff AFM cantilever probes with integrated sharp tips have been fabricated based on the well-established NANOSENSORS\u2122 PointProbePlus\u00ae process. Cantilever geometries of 100\u00b5m length and 7 or even 10\u00b5m thickness have been realized resulting in force constants of 600 and 2000 N\/m.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Dr. Oliver Krause, product developer at NANOSENSORS\u2122 is talking in this screencast about AFM probes for dynamic AFM with sub-nanometer amplitudes enabling imaging with atomic and sub-nanometer resolution Dynamic AFM with extremely small oscillation amplitudes of the probing tip enables Atomic Force Microscopy with atomic and even sub-atomic resolution. By adjusting the oscillation amplitude to&hellip;&nbsp;<a href=\"https:\/\/www.nanosensors.com\/blog\/nanosensors-ultrastiff-afm-probes-for-atomic-resolution\/\" class=\"\" rel=\"bookmark\">Read More &raquo;<span class=\"screen-reader-text\">NANOSENSORS\u2122 Ultrastiff AFM Probes for Atomic Resolution<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[5],"tags":[75,17,18,19,116,112,77,115,37,60,111,113,76,114],"class_list":["post-3937","post","type-post","status-publish","format-standard","hentry","category-videos","tag-afm","tag-afm-probes","tag-afm-tips","tag-atomic-force-microscopy","tag-atomic-resolution","tag-dynamic-mode-afm","tag-nanosensors","tag-non-contact","tag-pointprobe-plus","tag-scanning-probe-microscopy","tag-silicon-afm-probes","tag-silicon-cantilever","tag-spm","tag-tapping-mode"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3937","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=3937"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3937\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=3937"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=3937"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=3937"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}