{"id":3896,"date":"2015-05-26T13:00:05","date_gmt":"2015-05-26T10:00:05","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/nanosensors-q30k-plus-silicon-afm-probes-for-uhv-applications\/"},"modified":"2023-03-15T14:55:01","modified_gmt":"2023-03-15T12:55:01","slug":"nanosensors-q30k-plus-silicon-afm-probes-for-uhv-applications","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/nanosensors-q30k-plus-silicon-afm-probes-for-uhv-applications\/","title":{"rendered":"NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications"},"content":{"rendered":"

Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?<\/p>\n

For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).<\/p>\n

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe\u00ae plus series like a minimized variation in tip shape and a typical tip radius of less than 7nm for the standard silicon AFM tips.<\/p>\n

Q30K-Plus<\/strong> Standard silicon tips:<\/strong><\/p>\n

PPP-QNCHR<\/a><\/strong> for Non-Contact Mode\/Tapping Mode\u2122
\nResonance Frequency = 330 kHz
\nForce Constant = 42 N\/m
\nQuality Factor = 30000<\/p>\n

PPP-QFMR<\/a><\/strong> for Force Modulation Mode (hyperlink leading to : )
\nResonance frequency = 75 kHz
\nForce constant = 2.8 N\/m
\nQuality Factor = 30000<\/p>\n

Q30K-Plus<\/strong>\u00a0AFM tips with magnetic coating:<\/strong><\/p>\n

PPP-QLC-MFMR<\/a><\/strong> for magnetic force microscopy of soft magnetic samples and high operation stability under UHV conditions
\nResonance frequency = 75 kHz
\nForce constant = 2.8 N\/m
\nLow coercivity
\nQuality Factor > 30000<\/p>\n

SSS-QMFMR<\/a><\/strong> small radius of the coated tip, high aspect ratio at the last few hundred nanometers of the tip for outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions
\nResonance frequency = 75 kHz
\nForce constant = 2.8 N\/m
\nQuality Factor > 30000<\/p>\n

For more detailed information please click on the ordercodes to access the respective spec sheets on the NANOSENSORS website <\/a>or contact info@nanosensors.com.<\/p>\n

\"NANOSENSORS_Q30K_Plus_AFM_tip_for_UHV\"<\/a><\/p>\n

NANOSENSORS Q30K-Plus AFM tip for UHV applications<\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications? For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).<\/p>\n","protected":false},"author":2,"featured_media":3899,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[15],"tags":[82,17,18,19,97,31,95,94,27,98,99,96,93,100],"class_list":["post-3896","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-inside-nanosensors","tag-afm-cantilever","tag-afm-probes","tag-afm-tips","tag-atomic-force-microscopy","tag-high-q","tag-magnetic-force-microscopy-probe","tag-mfm-probes","tag-mfm-tips","tag-pointprobe-plus-ppp","tag-q-factor","tag-q30k-plus","tag-quality-factor","tag-uhv","tag-ultra-high-vacuum"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3896","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=3896"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3896\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/3899"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=3896"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=3896"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=3896"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}