{"id":3858,"date":"2014-11-17T14:53:31","date_gmt":"2014-11-17T12:53:31","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/product-screencast-nanosensors-xy-alignment-series\/"},"modified":"2023-03-15T14:55:17","modified_gmt":"2023-03-15T12:55:17","slug":"product-screencast-nanosensors-xy-alignment-series","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/product-screencast-nanosensors-xy-alignment-series\/","title":{"rendered":"Product Screencast NANOSENSORS\u2122 XY-Alignment Series"},"content":{"rendered":"<p>Product screencast on the NANOSENSORS\u2122 PointProbe\u00ae Plus XY-Alignment Series, held by the head of NANOSENSORS\u2122 R&amp;D department Thomas Sulzbach.<\/p>\n<div class=\"nv-iframe-embed\"><iframe loading=\"lazy\" title=\"Product screencast NANOSENSORS\u2122 XY-Alignment Series\" width=\"1200\" height=\"675\" src=\"https:\/\/www.youtube.com\/embed\/FevoNKBY0Tc?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" allowfullscreen><\/iframe><\/div>\n<p>A common problem of probe mounting in the AFM is the re-positioning of the tip after probe exchange. The laser must be re-aligned to the cantilever and eventually the feature of interest must be re-located.<br \/>\nFor more than 15 years NANOSENSORS\u2122 is offering AFM probes with self-alignment features and alignment chips (ALIGN) to overcome this problem. If the AFM head is equipped with a NANOSENSORS\u2122 alignment chip each probe mounted to the AFM will automatically be precisely aligned to continue experiments without major re-alignments. All NANOSENSORS\u2122 PointProbe\u00ae Plus AFM probes are equipped with alignment grooves and will be exactly aligned when plugged into the alignment chip.<br \/>\nNow, the PointProbe\u00ae Plus XY Alignment Series ensures an identical tip position after probe exchange and extends the self-alignment concept to probes of different type and different cantilever lengths.<br \/>\nFor achieving a self-alignment in direction along the cantilever axis, the support chips of the XY-alignment series are adjusted to the particular length of the cantilever. The support chip of long cantilevers is shorter. That of short cantilevers is longer. By that, the tip is always at the same position, independent from the cantilever length. The tip repositioning accuracy for different probe types is better than \u00b1 8\u00b5m.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Product screencast on the NANOSENSORS\u2122 PointProbe\u00ae Plus XY-Alignment Series, held by the head of NANOSENSORS\u2122 R&amp;D department Thomas Sulzbach. A common problem of probe mounting in the AFM is the re-positioning of the tip after probe exchange. The laser must be re-aligned to the cantilever and eventually the feature of interest must be re-located. For&hellip;&nbsp;<a href=\"https:\/\/www.nanosensors.com\/blog\/product-screencast-nanosensors-xy-alignment-series\/\" class=\"\" rel=\"bookmark\">Read More &raquo;<span class=\"screen-reader-text\">Product Screencast NANOSENSORS\u2122 XY-Alignment Series<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[5],"tags":[17,18,61,219,62,27,60],"class_list":["post-3858","post","type-post","status-publish","format-standard","hentry","category-videos","tag-afm-probes","tag-afm-tips","tag-align","tag-alignment-chip","tag-laser-alignment","tag-pointprobe-plus-ppp","tag-scanning-probe-microscopy"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3858","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=3858"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3858\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=3858"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=3858"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=3858"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}