The invention of the Alignment Chip by NANOSENSORS\u2122<\/strong> more than 10 years ago marked a big step in the direction of AFM probe design for easy to use AFM systems. It offered the possibility of a fast and easy tip exchange without the necessity to reposition the laser beam after the exchange of a probe.<\/p>\n <\/p>\n The alignment chip has three ridges that fit exactly into corresponding grooves on the backside of each of our PointProbe\u00ae Plus<\/strong> AFM probes. Due to this alignment mechanism the AFM probe can be exchanged with precise repositioning of the AFM tip within +\/- 2 \u00b5m. Still users had to accept a compromise because they were limited to a certain cantilever length in some commercially available AFM instruments.<\/p>\n The new generation of patented AFM probes called PointProbe\u00ae Plus XY-Alignment<\/strong> series now solves this problem and enables the usage of the Alignment Chip without any compromises in the direction of cantilever length. In conjunction with the Alignment Chip it ensures an identical tip position for all cantilever lengths (125 \u00b5m, 225 \u00b5m or 450 \u00b5m) of the PointProbe\u00ae Plus XY-Alignment<\/strong> series and the probes of the PointProbe\u00ae Plus<\/strong> series that are compatible with it. The AFM probes of different cantilever lengths tailored for contact mode, non-contact mode and force modulation mode can now be exchanged without readjustment of the laser beam.<\/p>\nAvailable types:
\n1. PPP-XYNCHR<\/strong><\/h3>\n