{"id":3787,"date":"2014-08-29T10:54:13","date_gmt":"2014-08-29T07:54:13","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/product-screencast-nanosensors-high-aspect-ratio-silicon-afm-probes\/"},"modified":"2023-03-15T14:55:26","modified_gmt":"2023-03-15T12:55:26","slug":"product-screencast-nanosensors-high-aspect-ratio-silicon-afm-probes","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/product-screencast-nanosensors-high-aspect-ratio-silicon-afm-probes\/","title":{"rendered":"Product Screencast NANOSENSORS\u2122 High Aspect Ratio Silicon AFM probes"},"content":{"rendered":"<div id=\"yts\">\n<div class=\"g-ytsubscribe\" data-channel=\"NANOSENSORS\" data-layout=\"full\" data-count=\"hidden\"><\/div>\n<\/div>\n<p>Product Screencast on the NANOSENSORS\u2122 High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.<\/p>\n<div class=\"nv-iframe-embed\"><iframe loading=\"lazy\" title=\"Product Screencast NANOSENSORS\u2122 High Aspect Ratio Silicon AFM probes\" width=\"1200\" height=\"675\" src=\"https:\/\/www.youtube.com\/embed\/fMPiDNtbxUw?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" allowfullscreen><\/iframe><\/div>\n<p><!--more--><br \/>\nFor measurements on samples with high aspect ratio features and sidewall angles approaching 90\u00b0 like trenches and contact holes in semiconductor device technology NANOSENSORS\u2122 has designed High Aspect Ratio tips AR5, AR5T, AR10 and AR10T showing near-vertical tip sidewalls.<\/p>\n<p>All models are based on NANOSENSORS\u2122 PointProbe\u00ae Plus technology. Those tips have an overall height of 10 &#8211; 15 \u03bcm which allows measurements on highly corrugated samples. At the last few micrometers the tips show a high aspect ratio portion that is radially symmetrical. The tip radius is typically 10 nm. We guarantee at least 15 nm.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Product Screencast on the NANOSENSORS\u2122 High Aspect Ratio Silicon AFM Probes by product developer Dr. Oliver Krause.<\/p>\n","protected":false},"author":2,"featured_media":3788,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[5],"tags":[35,36,33,34,32,37],"class_list":["post-3787","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-videos","tag-ar10","tag-ar10t","tag-ar5","tag-ar5t","tag-high-aspect-ratio","tag-pointprobe-plus"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3787","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=3787"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3787\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/3788"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=3787"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=3787"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=3787"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}