{"id":3786,"date":"2014-08-29T10:48:09","date_gmt":"2014-08-29T07:48:09","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/product-screencast-nanosensors-magnetic-force-microscopy-probes\/"},"modified":"2023-03-15T14:55:29","modified_gmt":"2023-03-15T12:55:29","slug":"product-screencast-nanosensors-magnetic-force-microscopy-probes","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/product-screencast-nanosensors-magnetic-force-microscopy-probes\/","title":{"rendered":"Product Screencast NANOSENSORS\u2122 Magnetic Force Microscopy probes"},"content":{"rendered":"<div id=\"yts\">\n<div class=\"g-ytsubscribe\" data-channel=\"NANOSENSORS\" data-layout=\"full\" data-count=\"hidden\"><\/div>\n<\/div>\n<p>Product Screencast on the NANOSENSORS\u2122 Magnetic Force Microscopy Silicon MFM Probes held by head of R&amp;D Thomas Sulzbach.<\/p>\n<div class=\"nv-iframe-embed\"><iframe loading=\"lazy\" title=\"Product Screencast NANOSENSORS\u2122 Magnetic Force Microscopy probes\" width=\"1200\" height=\"675\" src=\"https:\/\/www.youtube.com\/embed\/qssFxoZ8ELY?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" allowfullscreen><\/iframe><\/div>\n<p><!--more--><\/p>\n<p>For visualisation of magnetic domains by Scanning Probe Microscopy different Magnetic Force Microscopy probes are offered. They are designed to match the demands of a wide range of applications defined by the variety of magnetic samples with different properties. All the different magnetic coatings of the probes have proven an excellent long-term stability.<\/p>\n<p>The NANOSENSORS\u2122 Magnetic Force Microscopy probes are based on a well-established cantilever type that is specially tailored for the Magnetic Force Microscopy yielding high force sensitivity while simultaneously enabling Tapping Mode, Non-Contact and Lift Mode operation in air. In particular, the stiffness of the cantilever is a tradeoff between preventing the tip snapping to the surface during Tapping Mode or Non-Contact Mode operation and sensitivity to magnetic forces during Lift Mode operation.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Product Screencast on the NANOSENSORS\u2122 Magnetic Force Microscopy Silicon MFM Probes held by head of R&amp;D Thomas Sulzbach.<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[5],"tags":[31],"class_list":["post-3786","post","type-post","status-publish","format-standard","hentry","category-videos","tag-magnetic-force-microscopy-probe"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3786","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=3786"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3786\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=3786"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=3786"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=3786"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}