{"id":3782,"date":"2014-08-29T10:33:16","date_gmt":"2014-08-29T07:33:16","guid":{"rendered":"https:\/\/nanosensors.com\/blog\/product-screencast-nanosensors-supersharpsilicon\/"},"modified":"2023-03-15T14:55:35","modified_gmt":"2023-03-15T12:55:35","slug":"product-screencast-nanosensors-supersharpsilicon","status":"publish","type":"post","link":"https:\/\/www.nanosensors.com\/blog\/product-screencast-nanosensors-supersharpsilicon\/","title":{"rendered":"Product screencast NANOSENSORS SuperSharpSilicon"},"content":{"rendered":"<div id=\"yts\">\n<div class=\"g-ytsubscribe\" data-channel=\"NANOSENSORS\" data-layout=\"full\" data-count=\"hidden\"><\/div>\n<\/div>\n<p>Product Screencast on the NANOSENSORS\u2122 SuperSharpSilicon\u2122 High Resolution AFM Probes held by product developer Dr. Oliver Krause.<\/p>\n<div class=\"nv-iframe-embed\"><iframe loading=\"lazy\" title=\"Product screencast NANOSENSORS\u2122 SuperSharpSilicon\" width=\"1200\" height=\"675\" src=\"https:\/\/www.youtube.com\/embed\/9CsBdE31jKY?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" allowfullscreen><\/iframe><\/div>\n<p><!--more--><\/p>\n<p>NANOSENSORS\u2122 SuperSharpSilicon\u2122 High Resolution AFM Probes are designed for measurements with enhanced resolution of nanostructures and microroughnesses. They are realised by an unique tip manufacturing process leading to a further improvement of the tip sharpness with radii typically as low as 2 nm.<\/p>\n<p>The SuperSharpSilicon\u2122 AFM Probes are fabricated on the base of the NANOSENSORS\u2122 advanced PointProbe\u00ae Plus tip manufacturing process. Thus the geometry of holder and cantilever equals that of the PointProbe\u00ae Silicon-SPM-probes.<\/p>\n<p>Nanosensors SuperSharpSilicon\u2122 AFM Probes are available on different cantilever types for non-contact, acoustic or tapping mode applications as well as for force modulation techniques.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Product Screencast on the NANOSENSORS\u2122 SuperSharpSilicon\u2122 High Resolution AFM Probes held by product developer Dr. Oliver Krause.<\/p>\n","protected":false},"author":2,"featured_media":3783,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"neve_meta_sidebar":"","neve_meta_container":"","neve_meta_enable_content_width":"","neve_meta_content_width":0,"neve_meta_title_alignment":"","neve_meta_author_avatar":"","neve_post_elements_order":"","neve_meta_disable_header":"","neve_meta_disable_footer":"","neve_meta_disable_title":"","footnotes":""},"categories":[5],"tags":[29,28],"class_list":["post-3782","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-videos","tag-high-resolution-afm-probes","tag-supersharpsilicon"],"_links":{"self":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3782","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/comments?post=3782"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/posts\/3782\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media\/3783"}],"wp:attachment":[{"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/media?parent=3782"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/categories?post=3782"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nanosensors.com\/blog\/wp-json\/wp\/v2\/tags?post=3782"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}