Tag Archives: PointProbe Plus

articles on the PointProbe Plus AFM probe series

Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite

NANOSENSORS PPP-EFM AFM tips were used in the research for this article. Have a look at the abstract or follow the external link to the full article.

Figure 1: Crystal structure and domains in boracites. From: Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite
Figure 1: Crystal structure and domains in boracites.
From: Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite

Raymond G.P. McQuaid, Michael P. Campbell, Roger W. Whatmore, Amit Kumar, J. Marty Gregg
Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite. Nat. Commun. 8, 15105 doi: 10.1038/ncomms15105 (2017).

Abstract:
Ferroelectric domain walls constitute a completely new class of sheet-like functional material. Moreover, since domain walls are generally writable, erasable and mobile, they could be useful in functionally agile devices: for example, creating and moving conducting walls could make or break electrical connections in new forms of reconfigurable nanocircuitry. However, significant challenges exist: site-specific injection and annihilation of planar walls, which show robust conductivity, has not been easy to achieve. Here, we report the observation, mechanical writing and controlled movement of charged conducting domain walls in the improper-ferroelectric Cu3B7O13Cl. Walls are straight, tens of microns long and exist as a consequence of elastic compatibility conditions between specific domain pairs. We show that site-specific injection of conducting walls of up to hundreds of microns in length can be achieved through locally applied point-stress and, once created, that they can be moved and repositioned using applied electric fields.

Please follow this external link for the full article: https://www.nature.com/articles/ncomms15105

Creative Commons BYThe article “Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite” by McQuaid, R. G. P. et al. is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

NANOSENSORS™ Ultrastiff AFM Probes for Atomic Resolution

Dr. Oliver Krause, product developer at NANOSENSORS™ is talking in this screencast about AFM probes for dynamic AFM with sub-nanometer amplitudes enabling imaging with atomic and sub-nanometer resolution

Dynamic AFM with extremely small oscillation amplitudes of the probing tip enables Atomic Force Microscopy with atomic and even sub-atomic resolution. By adjusting the oscillation amplitude to the regime of short-range forces the impact of long-range forces on the detection mechanism can be suppressed effectively.
For stable operation the bending forces of the cantilever must be able to overcome the attractive tip-sample forces. Dynamic AFM with sub-nanometre amplitudes requires cantilevers with a force constant larger than 300N/m. The force constants of typical AFM probes for intermittent contact (Tapping Mode) are in the order of a few tens of N/m. Therefore, amplitudes of at least a few nanometres are required for stable operation.
Ultrastiff AFM cantilever probes with integrated sharp tips have been fabricated based on the well-established NANOSENSORS™ PointProbePlus® process. Cantilever geometries of 100µm length and 7 or even 10µm thickness have been realized resulting in force constants of 600 and 2000 N/m.