Tag Archives: MFM tips

NANOSENSORS 磁力显微镜探针 MFM

The screencast on NANOSENSORS AFM probes  for Magnetic Force Microscopy (MFM) is now available in Chinese on youtube  and youku

NANOSENSORS 磁力显微镜探针 MFM

在 Youtube

和在 Youku

http://v.youku.com/v_show/id_XMTQ2OTE4MzU4OA==.html?from=y1.7-1.2

本视频中介绍了NANOSENSORS公司生产的磁力显微镜探针系列 – MFM。 该探针允许在样品表面进行独立的表面形貌和磁性特征扫描,并提供不同的版本以满足不同应用需求。 其探针的磁性涂层具有优异的长效稳定性。

NANOSENSORS™的磁力显微镜探针是基于成熟的原子力显微镜探针技术。该探针具有优异的力敏感性,并可用于轻敲模式,非接触模式和空气中的抬升模 式。特别是,精心设计的悬臂的弹性系数可以使探针在保证磁性灵敏度的前提下,在各种工作模式下 (抬升模式、轻敲模式或非接触模式操作)自如地在表面扫描。

 

 

NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications

Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?

For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

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NANOSENSORS™ launches new Silicon MFM Probe Series

NANOSENSORS™ has launched a new Silicon MFM Probe Series today.

For visualisation of magnetic domains by scanning probe microscopy different magnetic force microscopy probes are necessary.

NANOSENSORS™ Silicon MFM Probes are based on the well-known PointProbe® Plus AFM probe. The probes are optimized in view of high sensitivity and enable Tapping Mode, Non-contact and lift mode operation in air. They are designed to match the demands of a wide range of applications defined by the variety of magnetic samples with different properties. All the different magnetic coatings of the probes show an excellent long-term stability.

The NANOSENSORS™ Silicon MFM Probe Series offers six different types of MFM Probes:

1. PPP-MFMR – Standard Magnetic Force Microscopy Probe

This standard probe for magnetic force microscopy provides a good sensitivity, resolution and coercitivity. The hard magnetic coating on the tip is optimized for high magnetic contrast and high lateral resolution.

Stable imaging of a variety of samples such as different recording media has been demonstrated with this probe.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 300 Oe
Magnetisation: 300 emu/cm³
Magnetic Tip Moment: ~ 10^13 emu
Guaranteed Tip Radius: < 50 nm
Achievable Lateral Resolution: < 50 nm

 

2. PPP-LM-MFMR – Low Momentum Magnetic Force Microscopy Probe This AFM probe is designed for reduced disturbance of the magnetic sample by the tip and for enhanced lateral resolution compared to the standard PPP-MFMR probe.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 250 Oe
Magnetisation: 150 emu/cm³
Magnetic Tip Moment: x0.5
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm

 

3. PPP-LC-MFMR – Low Coercivity Magnetic Force Microscopy Probe

This AFM tip is coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Soft Magnetic
Coercivity: 0.75 Oe
Magnetisation: 225 emu/cm³
Magnetic Tip Moment: x0.75
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm

 

4. SSS-MFMRSuperSharpSilicon™ High Resolution Magnetic Force Microscopy Probe

This MFM probe was especially designed for high resolution magnetic imaging. The well-known NANOSENSORS™ SuperSharpSilicon™ tip is used as a basis and is combined with a very thin hard magnetic coating. This results in an extremely small tip radius and a high aspect ratio on the last few hundred nanometers of the tip apex – the essential requirements for high lateral resolution down to 20 nm in ambient conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 125 Oe
Magnetisation: 80 emu/cm³
Magnetic Tip Moment: x0.25
Guaranteed Tip Radius: < 15 nm
Achievable Lateral Resolution: < 25 nm

 

5. SSS-QMFMR – SuperSharpSilicon™ High Resolution Magnetic Force Microscopy Probe with a high Q-factor

This special version of the high resolution magnetic force microscopy probe was especially tailored for applications in UHV. The high resolution and the magnetic characteristics are identical to the properties of the SSS-MFMR. Additionally it achieves a typical Q-factor of over 35 000 under UHV conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Hard Magnetic
Coercivity: 125 Oe
Magnetisation: 80 emu/cm³
Magnetic Tip Moment: x0.25
Guaranteed Tip Radius: < 15 nm
Achievable Lateral Resolution: < 25 nm
UHV Quality Factor: > 30 000

 

6. PPP-QLC-MFMR – Low Coercivity Magnetic Force Microscopy Probe with a high Q-factor – for applications in UHV

Like the PPP-LC-MFMR this AFM tip is coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Additionally it offers a Q-factor typically higher than 35 000 und UHV conditions.

Typical Values:
Force Constant: 2.8 N/m
Resonance Frequency: 75 kHz
Tipside Coating.: Soft Magnetic
Coercivity: 0.75 Oe
Magnetisation: 225 emu/cm³
Magnetic Tip Moment: x0.75
Guaranteed Tip Radius: < 30 nm
Achievable Lateral Resolution: < 35 nm
UHV Quality Factor: > 30 000

 

For further information please refer to the MFM Probe Series flyer.