NANOSENSORS™ announces new high-Q AFM probe

NANOSENSORS™ today announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and an enhanced signal to noise ratio for UHV applications.

q300k-afmprobeBased on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800 nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7 nm.

The first product of the new Q30K-Plus line will be commercially available starting January 2006 in the following versions:
PPP-QFMR and PPP-QNCHR. Other types for different operation modes and different tip shapes are being developed.

NANOSENSORS™ announces the new PointProbe® Plus AFM Probe

Improved Consistency and Resolution through an advanced Tip Manufacturing Process

TEM image of the PointProbe® Plus tip apex
TEM image of the PointProbe® Plus tip apex

Neuchatel, August 1st, 2004 – NANOSENSORS™ today announced its new product series, the PointProbe® Plus.

The new PointProbe® Plus (PPP) AFM probe combines the well-known features of the proven PointProbe® Series such as high application versatility and compatibility with most commercial AFMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For further information please refer to the PointProbe® Plus product flyer.