The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCAuD is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
A metallic layer (gold) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Property | Nominal Value | Specified Range |
---|---|---|
Resonance Frequency /kHz | 25 | 1 - 57 |
Force Constant /(N/m) | 0.2 | 0.01 - 1.87 |
Thickness /µm | 1 | 0.1 - 2.0 |
Mean Width /µm | 48 | 40 - 55 |
Length /µm | 225 | 215 - 235 |
Order Code | Number of AFM probes per pack | Data sheet | Coating |
---|---|---|---|
PPP-CONTSCAuD-10 | 10 | of all probes | Au (detector side) |
Please watch the new product screencast on NANOSENSORS™ PointProbe® Plus AFM Probes at http://youtu.be/watch?v=oo-NFxKOko8.
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For further information please contact your local distributor or NANOSENSORS™ directly.
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