The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCLAuD probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAuD is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Property | Nominal Value | Specified Range |
---|---|---|
Resonance Frequency /kHz | 190 | 146 - 236 |
Force Constant /(N/m) | 48 | 21 - 98 |
Thickness /µm | 7 | 6.0 - 8.0 |
Mean Width /µm | 38 | 30 - 45 |
Length /µm | 225 | 215 - 235 |
Order Code | Number of AFM probes per pack | Data sheet | Coating |
---|---|---|---|
PPP-NCLAuD-10 | 10 | of all probes | Au (detector side) |
Please watch the new product screencast on NANOSENSORS™ PointProbe® Plus AFM Probes at http://youtu.be/watch?v=oo-NFxKOko8.
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