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Electrostatic Force Microscopy/ Electrical Measurement (EFM)

Electrostatic Force Microscopy/ Electrical Measurement (EFM)

Electrostatic Force Microscopy/ Electrical Measurement (EFM)

Most popular in this category

PPP-EFM
PPP-EFM
  • PtIr5 coated AFM probe
  • C = 2.8 N/m; fo = 75 kHz

XY-Alignment Compatible Coated AFM Probe Types

XY-Alignment Compatible Coated AFM Probe Types
PPP-CONTSCPt
  • Contact Mode
  • PtIr5 coated AFM probe
  • C = 0.2 N/m; fo = 25 kHz
PPP-CONTSCAu
  • Contact Mode
  • Au coating (both sides)
  • C = 0.2 N/m; fo = 25 kHz
CDT-NCLR
  • Non-Contact Long AFM cantilever
  • Conductive Diamond coated AFM Tip
  • Back side Reflex coating
  • C = 72 N/m; fo = 210 kHz
PPP-NCLAu
  • Non-Contact Long AFM cantilever
  • Au coating (both sides)
  • C = 48 N/m; fo = 190 kHz
CDT-FMR
  • Force Modulation Mode
  • Conductive Diamond coated AFM Tip
  • Back side Reflex coating
  • C = 6.2 N/m; fo = 105 kHz
PPP-EFM
  • PtIr5 coated AFM probe
  • C = 2.8 N/m; fo = 75 kHz
PPP-FMAu
  • Force Modulation Mode
  • Au coating (both sides)
  • C = 2.8 N/m; fo = 75 kHz