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Akiyama-Probe

Novel self-sensing and self-actuating (-exciting) probe for dynamic mode atomic force microscopy


Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork’s extremely stable oscillation and the silicon cantilever’s reasonable spring constant with one probe.

Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system.

Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

For more information and technical details visit Akiyama-Probe website »


New Product screencast NANOSENSORS™ Akiyama-Probe (A-Probe)

Please watch the new product screencast on the Akiyama Probe (A-Probe) given by Dr. Terunobu Akiyama at http://youtu.be/watch?v=-mrs_-soChY.
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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG