AFM Probes, Atomic Force Microscope Tips NANOSENSORS AFM Probes
More than 15 years of R&D driven excellence

R&D is the foundation of NANOSENSORS™. We are dedicated to stay one step ahead of developments in the AFM business forestalling future demands. Our close cooperation with universities and research institutes in several projects ensures innovative products and cutting edge know-how.

Please have a look at some of our recent R&D projects:


Probe with signal lines and bond pads    Piezolever
Cantilever beam with integrated stress gauge and aperture tip    Probes for scanning near-field infrared microscopy (SNIM)
Field emitter probe with contact pads for wire bonding    Scanning probes with integrated field emission electron source