| Self-sensing and Self-actuating Probe |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| A-PROBE |
APROBE-10 new |
10 |
A-Probe is a self-sensing and self-actuating probe for Non-Contact / Tapping-Mode |
|
|
| Non-Contact / Tapping-Mode Sensors - preferred type - |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| CNT Probes |
CNT-NCH-2 |
2 |
Single/Double Wall Carbon Nanotube SPM probe for non-contact- / tapping-mode |
| CNT-NCH-5 |
5 |
| CNT-FM-2 |
2 |
Single/Double Wall Carbon Nanotube SPM probe for Non-Contact/Tapping Mode (Soft Tapping) |
| CNT-FM-5 |
5 |
|
| Advanced TEC™ |
ATEC-NC-10 |
10 |
AdvancedTEC™ Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode |
| ATEC-NC-20 |
20 |
| ATEC-NC-50 |
50 |
|
| ATEC-NCPt-10 new |
10 |
AdvancedTEC™ Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode Pt/Ir coating |
| ATEC-NCPt-20 new |
20 |
| ATEC-NCPt-50 new |
50 |
|
| ATEC-NCAu-10 new |
10 |
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode, detector and tip side: Au coating |
|
| POINTPROBE-PLUS® |
PPP-NCH-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode |
| PPP-NCH-20 |
20¹ |
| PPP-NCH-50 |
50 |
| PPP-NCH-W |
380² |
|
| PPP-NCHR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode detector side: Al-coating |
| PPP-NCHR-20 |
20¹ |
| PPP-NCHR-50 |
50 |
| PPP-NCHR-W |
380² |
|
| PPP-NCHPt-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode detector side: Pt/Ir-coating, tip side: Pt/Ir-coating |
| PPP-NCHPt-20 |
20¹ |
| PPP-NCHPt-50 |
50 |
| PPP-NCHPt-W |
380² |
|
| PPP-NCHAu-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- / tapping-mode, detector and tip side: Au-coating |
|
| PPP-NCHAuD-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, detector side: Au-coating |
|
| PPP-XYNCHR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode
detector side: Al-coating, Autoalignment Chip |
| PPP-XYNCHR-20 |
20¹ |
| PPP-XYNCHR-50 |
50 |
|
| PPP-NCST-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping |
| PPP-NCST-20 new |
20¹ |
| PPP-NCST-50 new |
50 |
| PPP-NCST-W new |
380² |
|
| PPP-NCSTR-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector side: Al-coating |
| PPP-NCSTR-20 new |
20¹ |
| PPP-NCSTR-50 new |
50 |
| PPP-NCSTR-W new |
380² |
|
| PPP-NCSTPt-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector and tip side: Pt/Ir coating |
| PPP-NCSTPt-20 new |
20¹ |
| PPP-NCSTPt-50 new |
50 |
| PPP-NCSTPt-W new |
380² |
|
| PPP-NCSTAu-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector and tip side: Au-coating |
|
| PPP-NCSTAuD-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector side: Au-coating |
|
| PPP-XYNCSTR-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector side: Al-coating, XY-auto alignment |
| PPP-XYNCSTR-20 new |
20¹ |
| PPP-XYNCSTR-50 new |
50 |
|
| PPP-QNCHR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode, High quality factor
detector side: Al-coating |
|
| PL2-NCH-10 |
10¹ |
Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact- / tapping-mode,
detector side: Al-coating |
|
| PL2-NCHR-10 |
10¹ |
Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact- / tapping-mode,
detector side: Al-coating |
|
| TL-NCH-10 |
10¹ |
Tipless silicon cantilever based on POINTPROBE® technology |
| TL-NCH-20 |
20¹ |
| TL-NCH-50 |
50 |
|
| PPP-RT-NCHR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,silicon cantilever for non-contact- /tapping-mode, tip rotated by 180°,
detector side: Al-coating |
| PPP-RT-NCHR-20 |
20¹ |
| PPP-RT-NCHR-50 |
50 |
|
| SUPERSHARP SILICON |
SSS-NCH-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, with SUPERSHARPSILICON tip |
| SSS-NCH-20 |
20¹ |
| SSS-NCH-50 |
50 |
| SSS-NCH-W |
370² |
|
| SSS-NCHR-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, with SUPERSHARPSILICON tip
detector side: Al-coating |
| SSS-NCHR-20 |
20¹ |
| SSS-NCHR-50 |
50 |
| SSS-NCHR-W |
370² |
|
| HIGH ASPECT RATIO |
AR5-NCH-10 |
10¹ |
HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1 |
| AR5-NCH-20 |
20¹ |
| AR5-NCH-50 |
50 |
| AR5-NCH-W |
370² |
|
| AR5T-NCH-10 |
10¹ |
TILT COMPENSATED HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1, tilt compensation 13° |
| AR5T-NCH-20 |
20¹ |
| AR5T-NCH-50 |
50 |
| AR5T-NCH-W |
365² |
|
| AR10-NCH-10 |
10¹ |
HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- / tapping-mode
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1 |
| AR10-NCH-20 |
20¹ |
| AR10-NCH-50 |
50 |
| AR10-NCH-W |
370² |
|
| AR10T-NCH-10 |
10¹ |
TILT COMPENSATED HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1, tilt compensation 13° |
| AR10T-NCH-20 |
20¹ |
| AR10T-NCH-50 |
50 |
| AR10T-NCH-W |
365² |
|
| AR5-NCHR-10 |
10¹ |
HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1,
detector side: Al-coating |
| AR5-NCHR-20 |
20¹ |
| AR5-NCHR-50 |
50 |
| AR5-NCHR-W |
370² |
|
| AR5T-NCHR-10 |
10¹ |
TILT COMPENSATED HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1, tilt compensation 13°, detector side: Al-coating |
| AR5T-NCHR-20 |
20¹ |
| AR5T-NCHR-50 |
50 |
| AR5T-NCHR-W |
365² |
|
| AR10-NCHR-10 |
10¹ |
HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- / tapping-mode
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1,
detector side: Al-coating |
| AR10-NCHR-20 |
20¹ |
| AR10-NCHR-50 |
50 |
| AR10-NCHR-W |
370² |
|
| AR10T-NCHR-10 |
10¹ |
TILT COMPENSATED HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1, tilt compensation 13°,
detector side: Al-coating |
| AR10T-NCHR-20 |
20¹ |
| AR10T-NCHR-50 |
50 |
| AR10T-NCHR-W |
365² |
|
| DIAMOND COATED |
DT-NCHR-10 |
10¹ |
DIAMOND COATED Sensor,
silicon cantilever for non-contact- /tapping-mode,
detector side: Al-coating,
tip side: Diamond-coating |
| DT-NCHR-20 |
20¹ |
| DT-NCHR-50 |
50 |
| DT-NCHR-W |
370² |
|
| CDT-NCHR-10 |
10¹ |
CONDUCTIVE DIAMOND COATED Sensor,
silicon cantilever for non-contact- /tapping-mode,
detector side: Al-coating,
tip side: conductive Diamond-coating |
| CDT-NCHR-20 |
20¹ |
| CDT-NCHR-50 |
50 |
| CDT-NCHR-W |
370² |
|
| PLATEAU TIPS |
PL2-NCH-10 new |
10¹ |
Silicon probe with Plateau tip for non-contact- / tapping-mode |
|
| PL2-NCHR-10 new |
10¹ |
Silicon probe with Plateau tip for non-contact- / tapping-modedetector side: Al-coating |
|
1 Including datasheet of all probes.
2 Including datasheet of up to 32 probes.
3 Sensor without coating available, delivery time upon request.
For detailed information please click on the order codes to view the respective datasheet.
|
| Non-Contact / Tapping-Mode Sensors - long cantilever - |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| POINTPROBE-PLUS® |
|
|
| PPP-NCL-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode, long cantilever |
| PPP-NCL-20 |
20¹ |
| PPP-NCL-50 |
50 |
| PPP-NCL-W |
380² |
|
| PPP-NCLR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode, long cantilever,
detector side: Al-coating |
| PPP-NCLR-20 |
20¹ |
| PPP-NCLR-50 |
50 |
| PPP-NCLR-W |
380² |
|
| PPP-NCLPt-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode, long cantilever,
detector side: Pt/Ir-coating,
tip side: Pt/Ir-coating |
| PPP-NCLPt-20 |
20¹ |
| PPP-NCLPt-50 |
50 |
| PPP-NCLPt-W |
380² |
|
| PPP-NCLAu-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for non-contact- /tapping-mode, long cantilever,
detector and tip side: Au-coating |
|
| PPP-NCLAuD-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for non-contact- / tapping-mode,
long cantilever,
detector side: Au-coating,/p |
|
| PL2-NCL-10 new |
10¹ |
Silicon-SPM-Probe with plateau tip,
silicon cantilever for non-contact- /tapping-mode,
long cantilever |
|
| PL2-NCLR-10 new |
10¹ |
Silicon-SPM-Probe with plateau tip,
silicon cantilever for non-contact- / tapping-mode,
long cantilever,
detector side: Al-coating |
|
| TL-NCL-10 |
10¹ |
Tipless silicon cantilever based
on POINTPROBE® technology |
| TL-NCL-20 |
20¹ |
| TL-NCL-50 |
50 |
|
| SUPERSHARP SILICON |
SSS-NCL-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
with SUPERSHARPSILICON tip |
| SSS-NCL-20 |
20¹ |
| SSS-NCL-50 |
50 |
| SSS-NCL-W |
370² |
|
| SSS-NCLR-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
with SUPERSHARPSILICON tip
detector side: Al-coating |
| SSS-NCLR-20 |
20¹ |
| SSS-NCLR-50 |
50 |
| SSS-NCLR-W |
370² |
|
| HIGH ASPECT RATIO |
AR5-NCL-10 |
10¹ |
HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1 |
| AR5-NCL-20 |
20¹ |
| AR5-NCL-50 |
50 |
| AR5-NCL-W |
370² |
|
| AR5-NCLR-10 |
10¹ |
HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1,
detector side: Al-coating |
| AR5-NCLR-20 |
20¹ |
| AR5-NCLR-50 |
50 |
| AR5-NCLR-W |
370² |
|
| DIAMOND COATED |
DT-NCLR-10 |
10¹ |
DIAMOND COATED Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
detector side: Al-coating,
tip side: Diamond-coating |
| DT-NCLR-20 |
20¹ |
| DT-NCLR-50 |
50 |
| DT-NCLR-W |
370² |
|
| CDT-NCLR-10 |
10¹ |
CONDUCTIVE DIAMOND COATED Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
detector side: Al-coating,
tip side: conductive Diamond-coating |
| CDT-NCLR-20 |
20¹ |
| CDT-NCLR-50 |
50 |
| CDT-NCLR-W |
370² |
|
1 Including datasheet of all probes.
2 Including datasheet of up to 32 probes.
3 Sensor without coating available, delivery time upon request.
For detailed information please click on the order codes to view the respective datasheet.
|
| Non-Contact / Tapping-Mode Sensors - special types - |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| POINTPROBE-PLUS® |
PPP-SEIH-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM |
| PPP-SEIH-20 |
20¹ |
| PPP-SEIH-50 |
50 |
| PPP-SEIH-W |
380² |
|
| PPP-SEIHR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM ,
detector side: Al-coating |
| PPP-SEIHR-20 |
20¹ |
| PPP-SEIHR-50 |
50 |
| PPP-SEIHR-W |
380² |
|
| SUPERSHARP SILICON |
SSS-SEIH-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM ,
with SUPERSHARPSILICON tip |
| SSS-SEIH-20 |
20¹ |
| SSS-SEIH-50 |
50 |
| SSS-SEIH-W |
370² |
|
| SSS-SEIHR-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM ,
with SUPERSHARPSILICON tip
detector side: Al-coating |
| SSS-SEIHR-20 |
20¹ |
| SSS-SEIHR-50 |
50 |
| SSS-SEIHR-W |
370² |
|
1 Including datasheet of all probes.
2 Including datasheet of up to 32 probes.
3 Sensor without coating available, delivery time upon request.
For detailed information please click on the order codes to view the respective datasheet.
|
| Contact Mode Sensors |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| Advanced TEC™ |
ATEC-CONT-10 |
10 |
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for contact mode |
| ATEC-CONT-20 |
20 |
| ATEC-CONT-50 |
50 |
|
| ATEC-CONTPt-10 new |
10 |
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for contact mode
Pt/Ir coating (both sides) |
| ATEC-CONTPt-50 new |
20 |
| ATEC-CONTPt-50 new |
50 |
|
| ATEC-CONTAu-10 new |
10 |
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for contact mode
Au coating (both sides) |
|
| POINTPROBE-PLUS® |
PPP-CONT-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode |
| PPP-CONT-20 |
20¹ |
| PPP-CONT-50 |
50 |
| PPP-CONT-W |
380² |
|
| PPP-CONTR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode
detector side: Al-coating |
| PPP-CONTR-20 |
20¹ |
| PPP-CONTR-50 |
50 |
| PPP-CONTR-W |
380² |
|
| PPP-XYCONTR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode
detector side: Al-coating
Autoalignment Chip |
| PPP-XYCONTR-20 |
20¹ |
| PPP-XYCONTR-50 |
50 |
|
| PPP-CONTPt-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode
detector side: Pt/Ir-coating,
tip side: Pt/Ir-coating |
| PPP-CONTPt-20 |
20¹ |
| PPP-CONTPt-50 |
50 |
| PPP-CONTPt-W |
380² |
|
| PPP-CONTAu-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode,
detector and tip side: Au-coating |
|
| PPP-CONTAuD-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode,
detector side: Au-coating |
|
| PPP-CONTSC-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode,
short cantilever |
| PPP-CONTSC-20 new |
20¹ |
| PPP-CONTSC-50 new |
50 |
| PPP-CONTSC-W new |
380² |
|
| PPP-CONTSCR-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector side: Al-coating
|
| PPP-CONTSCR-20 new |
20¹ |
| PPP-CONTSCR-50 new |
50 |
| PPP-CONTSCR-W new |
380² |
|
| PPP-CONTSCPt-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector side: Al-coating
|
| PPP-CONTSCPt-20 new |
20¹ |
| PPP-CONTSCPt-50 new |
50 |
|
| PPP-CONTSCAu-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector and tip side: Au-coating |
|
| PPP-CONTSCAuD-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector side: Au-coating |
|
| PL2-CONT-10 new |
10¹ |
Silicon probe with Plateau tip for contact mode |
|
| PL2-CONTR-10 new |
10¹ |
Silicon probe with Plateau tip for contact mode,
detector side: Al-coating
|
|
| TL-CONT-10 |
10¹ |
Tipless silicon cantilever based on POINTPROBE®
technology |
| TL-CONT-20 |
20¹ |
| TL-CONT-50 |
50 |
|
| PPP-RT-CONTR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode,
tip rotated by 180°, detector side: Al-coating3 |
| PPP-RT-CONTR-20 |
20¹ |
| PPP-RT-CONTR-50 |
50 |
|
| DIAMOND COATED |
DT-CONTR-10 |
10¹ |
DIAMOND COATED Sensor,
silicon cantilever for contact mode,
detector side: Al-coating |
| DT-CONTR-20 |
20¹ |
| DT-CONTR-50 |
50 |
|
| CDT-CONTR-10 |
10¹ |
CONDUCTIVE DIAMOND COATED Sensor,
silicon cantilever for contact mode,
detector side: Al-coating |
| CDT-CONTR-20 |
20¹ |
| CDT-CONTR-50 |
50 |
|
| POINTPROBE-PLUS® |
PPP-ZEILR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode, for Zeiss Veritekt AFM,
detector side: Al-coating3 |
| PPP-ZEILR-20 |
20¹ |
| PPP-ZEILR-50 |
50 |
| PPP-ZEILR-W |
380² |
|
1 Including datasheet of all probes.
2 Including datasheet of up to 32 probes.
3 Sensor without coating available, delivery time upon request.
For detailed information please click on the order codes to view the respective datasheet.
|
| Sensors for Special Application Modes |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| Advanced TEC™ |
ATEC-FM-10 |
10 |
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for force modulation mode |
| ATEC-FM-20 |
20 |
| ATEC-FM-50 |
50 |
|
| ATEC-EFM-10 new |
10 |
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for force modulation mode
Pt/Ir coating (both sides) |
| ATEC-EFM-20 new |
20 |
| ATEC-EFM-50 new |
50 |
|
| ATEC-FMAu-10 new |
10 |
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for force modulation mode
Au coating (both sides) |
|
| POINTPROBE-PLUS® |
PPP-LFMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for lateral / friction force microscopy,
detector side: Al-coating3 |
| PPP-LFMR-20 |
20¹ |
| PPP-LFMR-50 |
50 |
| PPP-LFMR-W |
380² |
|
| PPP-FM-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode |
| PPP-FM-20 |
20¹ |
| PPP-FM-50 |
50 |
| PPP-FM-W |
380² |
|
| PPP-FMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode,
detector side: Al-coating |
| PPP-FMR-20 |
20¹ |
| PPP-FMR-50 |
50 |
| PPP-FMR-W |
380² |
|
| PPP-FMAu-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for force modulation mode,
detector and tip side: Au-coating |
|
| PPP-FMAuD-10 new |
10¹ |
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for force modulation mode,
detector side: Au-coating |
|
| PPP-QFMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode,
High quality factor
detector side: Al-coating |
|
| PL2-FM-10 new |
10¹ |
Silicon probe with Plateau tip for force modulation mode |
|
| PL2-FMR-10 new |
10¹ |
Silicon probe with Plateau tip for force modulation mode,
detector side: Al-coating
|
|
| TL-FM-10 |
10¹ |
Tipless silicon cantilever based
on POINTPROBE® technology |
| TL-FM-20 |
20¹ |
| TL-FM-50 |
50 |
|
| PPP-RT-FMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode,
tip rotated by 180°, detector side: Al-coating3 |
| PPP-RT-FMR-20 |
20¹ |
| PPP-RT-FMR-50 |
50 |
|
| SUPERSHARP SILICON |
SSS-FM-10 |
10¹ |
SUPERSHARPSILICONTM-SPM-Probe,
silicon cantilever for force modulation mode,
with SUPERSHARPSILICONTM tip
|
| SSS-FM-20 |
20¹ |
| SSS-FM-50 |
50 |
| SSS-FM-W |
370² |
|
| SSS-FMR-10 |
10¹ |
SUPERSHARPSILICONTM-SPM-Probe,
silicon cantilever for force modulation mode,
with SUPERSHARPSILICONTM tip
detector side: Al-coating
|
| SSS-FMR-20 |
20¹ |
| SSS-FMR-50 |
50 |
| SSS-FMR-W |
370² |
|
| DIAMOND COATED |
DT-FMR-10 |
10¹ |
DIAMOND COATED Sensor,
silicon cantilever for force modulation mode,
detector side: Al-coating |
| DT-FMR-20 |
20¹ |
| DT-FMR-50 |
50 |
| DT-FMR-W |
370² |
|
| CDT-FMR-10 |
10¹ |
CONDUCTIVE DIAMOND COATED Sensor,
silicon cantilever for force modulation mode,
detector side: Al-coating |
| CDT-FMR-20 |
20¹ |
| CDT-FMR-50 |
50 |
| CDT-FMR-W |
370² |
|
| POINTPROBE-PLUS® |
PPP-EFM-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Electrostatic Force Microscopy,
detector side: Pt/Ir-coating,
tip side: Pt/Ir-coating |
| PPP-EFM-20 |
20¹ |
| PPP-EFM-50 |
50 |
| PPP-EFM-W |
370² |
|
| PPP-MFMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
detector side: Al-coating, tip side: hard magnetic coating |
| PPP-MFMR-20 |
20¹ |
| PPP-MFMR-50 |
50 |
| PPP-MFMR-W |
370² |
|
| PPP-LM-MFMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
Low Moment,
detector side: Al-coating, tip side: hard magnetic coating |
| PPP-LM-MFMR-20 |
20¹ |
| PPP-LM-MFMR-50 |
50 |
|
| PPP-LC-MFMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
Low Coercivity,
detector side: Al-coating, tip side: soft magnetic coating |
| PPP-LC-MFMR-20 |
20¹ |
| PPP-LC-MFMR-50 |
50 |
|
| PPP-QLC-MFMR-10 |
10¹ |
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
Low Coercivity, high quality factor for UHV applications,
detector side: Al-coating, tip side: soft magnetic coating |
|
| SUPERSHARP SILICON |
SSS-MFMR-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for high resolution
Magnetic Force Microscopy,
detector side: Al-coating, tip side: hard magnetic coating |
| SSS-MFMR-20 |
20¹ |
| SSS-MFMR-50 |
50 |
|
| SSS-QMFMR-10 |
10¹ |
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
high quality factor for UHV applications,
detector side: Al-coating, tip side: hard magnetic coating |
|
1 Including datasheet of all probes.
2 Including datasheet of up to 32 probes.
3 Sensor without coating available, delivery time upon request.
For detailed information please click on the order codes to view the respective datasheet.
|
| Self-sensing and Self-actuating Probe |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| A-PROBE |
APROBE-10 |
10 |
A-Probe is a self-sensing and self-actuating probe for Non-Contact / Tapping-Mode |
|
|
| Evaluation Kits |
| Tip |
Order-code |
Sensors per set |
Short description |
|
| POINTPROBE-PLUS® |
KIT-1 |
22 |
POINTPROBE-PLUS® Evaluation Kit 1 containing: 4 NCH, 4 NCHR, 2 CONT, 2 CONTR, 2 MFMR, 4 FM, 4 FMR |
| KIT-2 |
19 |
POINTPROBE-PLUS® Evaluation Kit 2 containing: 4 NCL, 4 NCLR, 3 CONT, 2 CONTR, 2 EFM, 2 LFM, 2 LFMR |
|
|
| Alignment Chip |
| |
Order-code |
Sensors per set |
Short description |
|
|
ALIGN-10 |
10 |
ALIGNMENT CHIP suitable for all
POINTPROBE-PLUS®, DIAMOND COATED,
HIGH ASPECT RATIO and SUPERSHARPSILICON probes |
|
For detailed information please click on the order codes to view the respective datasheet.
|
| Calibration Standards |
| |
Order-code |
Sensors per set |
Short description |
|
| Lateral |
2D100 * |
1 |
CALIBRATION STANDARD for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 100 nm pitch |
| 2D200 * |
1 |
CALIBRATION STANDARD for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 200 nm pitch |
| 2D300 * |
1 |
CALIBRATION STANDARD for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 300 nm pitch |
|
| Height |
H8 * |
1 |
HEIGHT STANDARD for very precise z-calibration, nominal step height: 8 nm |
|
| Flatness |
FLAT |
1 |
FLATNESS STANDARD for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10 nm on a 100x100 µm2 area |
| FLAT-CERT |
1 |
FLAT including CERTIFICATION
by the Physikalisch Technische Bundesanstalt (PTB) |
|
* Certification available upon request.
For detailed information please click on the order codes to view the respective datasheet.
|
SELECTION
Subject to availability sets of 10 probes or sets of 20 probes can be selected according to customer requirements (e.g. with narrow tolerances). The additional selection fee is 66 US$ per set.
TERMS AND CONDITIONS |
|
TERMS:
Prices are FCA (Free CArrier) distribution center with an additional 80 US$ flat rate for packing & insurance, exclusive of any tax and custom duties. Shipment is via Federal Express. Other carriers are subject to an additional handling charge of 100 US$.
DELIVERY:
Delivery period is 2 working days if in stock, otherwise up to 3 months depending on status of processing. |
|
