PointProbe® Plus XY-Alignment AFM-Probe   Available Probe Types:   Types without Reflex Coating Types with Reflex coating Application Force constant / [N/m] (typical) Resonance frequency / [kHz] (typical)  Contact     PPP-XYCONTRnew!  XY-auto alignment with Alignment Chip  Contact Mode 0.2 13  PPP-CONTSCnew!  PPP-CONTSCRnew!  PPP-CONTSCAuDnew! Contact Mode (short cantilever) 0.2 25  Non-Contact     PPP-XYNCHRnew!  XY-auto alignment with Alignment Chip  Non-Contact/  Tapping Mode  High frequency 42 330  PPP-XYNCSTRnew! XY-auto alignment with Alignment Chip  Non-Contact/ Soft Tapping Mode 7.4 160  PPP-NCL  PPP-NCLR  Non-Contact/  Tapping Mode  (Long cantilever) 48 190  PPP-NCLAuDnew! Tapping Mode  (Long cantilever) 48 190    PPP-SEIHR  Non-contact / Tapping Mode  Seiko  (High frequency) 15 130  Special   PPP-FM  PPP-FMR  Force Modulation Mode 2.8 75    PPP-RT-FMR  Force Modulation Mode 2.8 75    PPP-LFMR  Lateral / friction force  Microscopy 0.2 25    PPP-QFMRnew!  High Quality Factor  Force Modulation Mode 2.8 75    XY-Alignment Compatible SuperSharpSilicon™ Types   Types without Reflex Coating Types with Reflex coating Application Force constant / [N/m] (typical) Resonance frequency / [kHz] (typical)  Non-Contact   SSS-NCL  SSS-NCLR  Non-Contact/  Tapping Mode  Long cantilever 48 190  SSS-SEIH  SSS-SEIHR  Seiko Non-Contact Mode  High frequency 15 130  SSS-FM  SSS-FMR Force Modulation Mode 2.8 75    XY-Alignment Compatible High Aspect Ratio Probe Types   Types without Reflex Coating Types with Reflex coating Application Force constant / [N/m] (typical) Resonance frequency / [kHz] (typical) Special Tip Versions  Non-Contact   AR5-NCL  AR5-NCLR  Non-Contact /  Tapping Mode  Long cantilever 48 190 High Aspect Ratio (5:1)    XY-Alignment Compatible Coated Probe Types   Tipside Coatings Type Application Force constant / [N/m] (typical) Resonance frequency / [kHz] (typical)  Contact   Platinum-Iridium PPP-CONTSCPtnew! Contact Mode Short Cantilever 0.2 25 Gold PPP-CONTSCAunew! Contact Mode Short Cantilever 0.2 25  Non-Contact  Diamond  DT-NCLR  Non-Contact /  Tapping Mode  Long cantilever 48 190 Conductive Diamond  CDT-NCLR  Non-Contact /  Tapping Mode  Long cantilever 48 190 Platinum-Iridium  PPP-NCLPt  Non-Contact/  Tapping Mode  Long cantilever 48 190 Gold  PPP-NCLAunew! Non-Contact/  Tapping Mode  Long cantilever 48 190  Special  Diamond  DT-FMR  Force Modulation  Mode 2.8 75 Conductive Diamond  CDT-FMR  Force Modulation  Mode 2.8 75 Hard Magnetic  PPP-MFMR  Magnetic Force Microscopy 2.8 75 Hard Magnetic  PPP-LM-MFMR  Low Moment  Magnetic Force Microscopy 2.8 75 Soft Magnetic  PPP-LC-MFMR  Low Coercivity  Magnetic Force Microscopy 2.8 75 Soft Magnetic  PPP-QLC-MFMR  High Quality-Factor  Low Coercivity  Magnetic Force Microscopy 2.8 75 Hard Magnetic  SSS-MFMR  SuperSharp Silicon  Magnetic Force Microscopy 2.8 75 Hard Magnetic  SSS-QMFMR  SuperSharp Silicon  High Quality Factor  Magnetic Force Microscopy 2.8 75 Platinum-Iridium  PPP-EFM  Electrostatic Force Microscopy 2.8 75 Gold  PPP-FMAunew! Electrostatic Force Microscopy 2.8 75    XY-Alignment Compatible Tipless Cantilever Probe Types   Types without Reflex coating Types with Reflex coating Application Force constant / [N/m] (typical) Resonance frequency / [kHz] (typical)  Non-Contact   TL-NCL    Non-Contact/  Tapping Mode  Long cantilever 48 190  PL2-NCLnew!  PL2-NCLRnew! Plateau Tip Non-Contact/ Tapping Mode Long cantilever 48 190  Special   TL-FM    Tipless Force Modulation Mode 2.8 75  PL2-FMnew!  PL2-FMRnew! Plateau Tip Force Modulation Mode 2.8 75 NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG