PointProbe® Plus AFM-Probe

  Available Probe Types:

  Types without Reflex Coating Types with Reflex coating Application Force constant /
[N/m]
(typical)
Resonance frequency /
[kHz]
(typical)
 Contact   PPP-CONT  PPP-CONTR  Contact Mode 0.2 13
   PPP-XYCONTRnew!  XY-auto alignment with Alignment Chip
 Contact Mode
0.2 13
PPP-CONTSC new!  PPP-CONTSCR new!  Contact Mode (short cantilever) 0.2 25
   PPP-ZEILR  Contact Mode, Seiko
 or Zeiss (Long cantilever)
1.6 27
 Non-Contact   PPP-NCH  PPP-NCHR  Non-Contact/
 Tapping Mode
 High frequency
42 330
   PPP-XYNCHRnew!  XY-auto alignment with Alignment Chip
 Non-Contact/
 Tapping Mode
 High frequency
42 330
   PPP-QNCHRnew!  High Quality Factor
 Non-Contact /
 Tapping Mode
 (High frequency)
42 330
 PPP-NCL  PPP-NCLR  Non-Contact/
 Tapping Mode
 (Long cantilever)
48 190
 PPP-NCSTnew!  PPP-NCSTRnew! Tapping Mode
 (Soft Tapping)
7.4 160
   PPP-SEIHR  Non-contact / Tapping Mode
 Seiko
 (High frequency)
15 130
 Special     PPP-LFMR  Lateral / friction force
 Microscopy
0.2 25
 PPP-FM  PPP-FMR  Force Modulation Mode 2.8 75
   PPP-QFMR  High Quality Factor
 Force Modulation Mode
2.8 75