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PtSi-CONT

Platinum Silicide Probes Contact Mode

NANOSENSORS™ PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant.

For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.2 0.02 - 0.77
Resonance Frequency /kHz 13 6 - 21

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PtSi-CONT-10 10 of all probes PtSi (reflective)
PtSi-CONT-20 20 of all probes PtSi (reflective)
PtSi-CONT-50 50 without PtSi (reflective)


Product Screencast NANOSENSORS™ Platinum Silicide AFM Probes

Please watch the new product screencast on the NANOSENSORS™ Platinum Silicide AFM Probes at http://youtu.be/watch?v=w0Tjg08ai-I.
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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG