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SSS-MFMR

AFM probes for high resolution imaging – NANOSENSORS SuperSharpSilicon™ series video reaches 500 views mark

The NANOSENSORS screencast on SuperSharpSilicon™ AFM probes for high resolution imaging held by Dr. Oliver Krause just passed the 500 views mark. Congratulations Oliver! NANOSENSORS™… Read More »AFM probes for high resolution imaging – NANOSENSORS SuperSharpSilicon™ series video reaches 500 views mark

Observing single magnetite nanoparticles with a diameter of 10nm by using NANOSENSORS SSS-MFMR AFM probes

Figure 12 from: A. Krivcov et. al, Understanding electrostatic and magnetic forces in magnetic force microscopy: towards single supermagnetic nanoparticle resolution: Figure 12. (a) topography of copper substrate with single magnetite nanoparticle; (b) phase image in 11 nm lift height with an attraction at the place of the nanoparticle; (c) Cross section of a single magnetite nanoparticle (dotted line in (a)) with 10 nm diameter taken on copper substrate with NANOSENSORS SSS-MFMR AFM probe

In their publication “Understanding electrostatic and magnetic forces in magnetic force microscopy: towards single supermagnetic nanoparticle resolution” Alexander Krivcov, Tanja Junkers and Hildegard Möbius describe… Read More »Observing single magnetite nanoparticles with a diameter of 10nm by using NANOSENSORS SSS-MFMR AFM probes