Tag Archives: Scanning Probe Microscopy

Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark

The screencast held by Head of R&D Thomas Sulzbach  on the  NANOSENSORS PointProbe® Plus Silicon AFM probe series  with a consistent tip shape leading to more reproducible results has just passed the 500 views mark.
Congratulations Thomas!

Screencasts on the PointProbe® Plus are also available in Japanese

and in Chinese:

also on youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html