Tag Archives: Scanning Probe Microscopy

Rapid mapping of polarization switching through complete information acquisition

A NANOSENSORS PPP-EFM AFM tip was used in the research for this paper.

Nature Comm: GMode makes piezoresponse force microscopy 1000 times faster.

Suhas Somnath,, Alex Belianinov, Sergei V. Kalinin, Stephen Jesse, Rapid mapping of polarization switching through complete information acquisition, Nature Communications (2016), 7, 13290, 2041-1723, DOI: 10.1038/ncomms13290

Congratulations to the authors!
Rapid mapping of polarization switching through complete information acquisition
Rapid mapping of polarization switching through
complete information acquisition

 

PointProbe Plus XL – Extra Tall Tips for Nanoprofiling

Are you looking for extra tall tips for nanoprofiling and other applications in this direction? Then look no further. There is a PointProbe Plus version with a tip height of 50µm. On the NANOSENSORS Special Developments List http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf  on page 7 you will find three types of cantilevers (one for non-contact mode, one for force modulation mode and one for contact mode).

NANOSENSORS extra tall PointProbe Plus AFM tip - tip height 50µm - typical tip radius 10nm
NANOSENSORS extra tall PointProbe Plus AFM tip – tip height 50µm