NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication.
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The article “Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy” by Tobias Cramer et. al. is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/