NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication.
For the full article have a look at:
The article “Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy” by Tobias Cramer et. al. is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
The screencast held by Head of R&D Thomas Sulzbach on the NANOSENSORS PointProbe® Plus Silicon AFM probe series with a consistent tip shape leading to more reproducible results has just passed the 500 views mark.
Screencasts on the PointProbe® Plus are also available in Japanese
and in Chinese:
also on youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html