Tag Archives: Platinum Silicide AFM probes

Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)

Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese.

NANOSENSORS™ Platinum Silicide AFM probes are designed for conductive AFM imaging where the combination of excellent conductivity, high wear resistance and a small tip radius is required. Platinum Silicide AFM tips are made of highly conductive platinum silicide which unites high conductivity (higher than conductive diamond coating and as good as metal coated tips) with a high wear resistance (much higher than metal coated probes and almost as good as diamond coated probes). Additionally the new PtSi probes have a slightly decreased tip radius compared to standard metal coated AFM probes. They can be used for any kind of electric or electrostatic AFM measurement, except SSRM.

– Hard, solid and conductive silicide apex
– Smaller tip radius (nominal 25nm) than normal metal coated probes (nominal 30nm). About five to six times smaller radius when – compared to diamond coated tips (nominal 150nm)
– Almost metal like conductivity.
– high wear resistance compared to silicon and PtIr coated tips

NANOSENSORS™ Platinum Silicide probes are ideally suited for
– Conductive AFM (CAFM)
– Tunneling AFM (TUNA)
– Scanning Capacitance Microscopy (SCM)
– Kelvin Probe Force Microscopy (KPFM)
– Electrostatic Force Microscopy (EFM)

视频介绍 – 铂硅原子力显微镜探针 – NANOSENSORS™ –

视频介绍 – 铂硅原子力显微镜探针 – NANOSENSORS™ –

在 Youtube

和在  Youku

http://v.youku.com/v_show/id_XNjkzNzU3ODky.html?from=y1.7-1.2

NANOSENSORS公司的吴烨娴博士在本视频中介绍了铂硅原子力显微镜探针。该种探针结合了优良的导电性,高耐磨性和超小型针尖半径为一体,专为导电或静电AFM成像设计。

与传统的导电型AFM针尖比较,它的质地更加地坚硬。和金刚石涂层的AFM针尖比较,铂硅探针的尖端半径只有1/5甚至1/6(~25纳米),而却有其 10倍的导电系数。而且这种探针的磨损率与硅和其他金属涂覆的探针相比显著降低。此外,硅化铂几乎耐受所有类型的化学药品。

http://www.nanosensors.com/Platinum_Silicide.pdf

此款铂硅AFM针尖可适用于
导电原子力显微镜
隧道原子力显微镜
扫描电容显微镜
开尔文探针力显微镜 和
静电力显微镜

需要注意的时,由于此类铂硅针尖的尖端有很高的长径比和很小的曲率半径,此类针尖不适用于表面受力很大的扫描扩展电阻显微镜