piezo force microscopy

Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films

by NANOSENSORS
30 August 201815 March 2023
Science & Technology

Figure 1 from Borderon et al. Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films: Piezoelectric Force Microscopy (PFM) characterization of the epitaxial PZT thin films. The scan size is 2 μm×1 μm for the c-domain ample and 1 μm × 0.5 μm for the a/c-domain sample. PFM characterization done with ATEC-EFM AFM probe

A NANOSENSORS AdvancedTEC ATEC-EFM PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al Domain… Read More »Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films