Tag Archives: MFM Probes

AFM probes for Magnetic Force Microscopy Screencast passed 1000 views mark

NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM)  for scanning and studying sample surfaces with magnetic features:

PPP-MFMR
PPP-LM-MFMR
PPP-LC-MFMR
PPP-QLC-MFMR
SSS-MFMR
SSS-QMFMR

The screencast introducing the different properties of these AFM probes and their applications held by our Head of R&D Thomas Sulzbach has just passed the 1000 views mark. Congratulations Thomas!

NANOSENSORS 磁力显微镜探针 MFM

The screencast on NANOSENSORS AFM probes  for Magnetic Force Microscopy (MFM) is now available in Chinese on youtube  and youku

NANOSENSORS 磁力显微镜探针 MFM

在 Youtube

和在 Youku

http://v.youku.com/v_show/id_XMTQ2OTE4MzU4OA==.html?from=y1.7-1.2

本视频中介绍了NANOSENSORS公司生产的磁力显微镜探针系列 – MFM。 该探针允许在样品表面进行独立的表面形貌和磁性特征扫描,并提供不同的版本以满足不同应用需求。 其探针的磁性涂层具有优异的长效稳定性。

NANOSENSORS™的磁力显微镜探针是基于成熟的原子力显微镜探针技术。该探针具有优异的力敏感性,并可用于轻敲模式,非接触模式和空气中的抬升模 式。特别是,精心设计的悬臂的弹性系数可以使探针在保证磁性灵敏度的前提下,在各种工作模式下 (抬升模式、轻敲模式或非接触模式操作)自如地在表面扫描。

 

 

NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications

Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?

For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

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