Tag Archives: Magnetic Force Microscopy probe

AFM Probes for Magnetic Force Microscopy Screencast has 500 views

The screencast on NANOSENSORS AFM probes for Magnetic Force Microscopy has just passed the 500 views mark.

If you want to learn more on our AFM probes for Magnetic Force Microsocopy please have a look at https://youtu.be/qssFxoZ8ELY

Magnetic image (phase shift) of an experimental hard disk measured with a NANOSENSORS SSS-MFMR AFM probe
Magnetic image (phase shift) of an experimental hard disk with varied bit length (courtesy of Maxtor) measured with a NANOSENSORS SSS-MFMR AFM probe

NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications

Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?

For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

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