Visit us at Toyo booth 4B-705 at JASIS in Makuhari, Japan this week
Visit us at Toyo booth 4B-705 at JASIS 2015 in Makuhari, Japan this week.
Visit us at Toyo booth 4B-705 at JASIS 2015 in Makuhari, Japan this week.
The NANOSENSORS screencast on SuperSharp Silicon AFM tips for high resolution imaging is now available in Chinese on youtube and youku http://v.youku.com/v_show/id_XOTIzNjg0NDQ0.html . NANOSENSORS公司的吴烨娴博士在本视频中介绍了SuperSharpSilicon原子力显微镜探针。SSS超尖硅针尖是为超高精度的原子力显微 镜成像设计的。它适用于超精细结构,如小于10nm特征粗糙度表面的测量。该探针基于NANOSENSORS的标准AFM探针 PointProbePlus系统。在一个特殊的尖端锐化过程后,针尖半径由7nm减小为2nm。… Read More »视频介绍 – SuperSharpSilicon原子力显微镜探针 – NANOSENSORS™
Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.