Tag Archives: Electrochemical tips

NANOSENSORS™: AFM Cantilevers for Scanning Electrochemical Microscopy

Christoph Richter from NANOSENSORS™ R&D department is talking in this screencast about his latest development: AFM Cantilevers for Scanning Electrochemical Microscopy.


These are the very first batch fabricated silicon probes for combined Atomic Force Microscopy (AFM) and Scanning Electrochemical Microscopy (SECM). They are made to perform voltammetric or corrosion studies in liquids with an outstanding lateral resolution and a high electromical-sensitivity.

Based on the well known PointProbe Plus AFM tip, the worlds most established cantilever probe for topography measurements, our Electrochemical probes are featuring its typical support chip and cantilever dimensions. By adding and structuring different functional layers we created a tool for electrochemical studies which still keeps the excellent lateral and vertical resolution of its origin with a tip height of 10-15µm and a radius of curvature of better than 40nm. The exposed area of the conical Platinum electrode on the very end of the tip is less than 2µm². Due to the smart layout of the conductive line and the almost pin hole free silicon nitride isolation layer, the probe offers low leakage currents and a high long term stability.

The Electrochemical AFM probes can be found at our Special Development List:
http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf
More information at info@nanosensors.com

High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes

Another impressive Scanning Electrochemical AFM measurement out of the publication from Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory, captured with EC-AFM  probes developed and manufactured by our colleague Christoph Richter.

ec-paper_richter03

The graph is showing feedback mode SECM-AFM images of gold patterned silicon oxide substrate immersed in 1 mM FcMeOH/0.1 M KNO3. (a) Topographical scan acquired in contact mode and (b) electrochemical scan recorded at a lift height of 150 nm. http://pubs.acs.org/doi/abs/10.1021/ac500946v

Christoph`s AFM tips are the first ever commercially available silicon AFM probes for Electrochemical applications. You will find the EC-AFM tips at the NANOSENSORS Special Development List on our homepage: http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf

Reprinted with permission from “High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes”,  Andrew J. Wain, Andrew J. Pollard, and Christoph Richter, Anal. Chem., 2014, 86 (10), pp 5143–5149. Copyright 2014 American Chemical Society.

High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes

Andrew Wain and Andrew Pollack from UK`s National Physics Laboratory got impressive Scanning Electrochemical AFM measurement results captured with EC-AFM  probes developed and manufactured by our colleague Christoph Richter.

ECpaper_fig01

http://pubs.acs.org/doi/abs/10.1021/ac500946v

Christoph`s AFM tips are the first ever commercially available silicon AFM probes for Electrochemical applications. You will find the EC-AFM tips at the NANOSENSORS Special Development List on our homepage: http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf

Reprinted with permission from “High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes”,  Andrew J. Wain, Andrew J. Pollard, and Christoph Richter, Anal. Chem., 2014, 86 (10), pp 5143–5149. Copyright 2014 American Chemical Society.