Tag Archives: C-AFM

Rapid mapping of polarization switching through complete information acquisition

A NANOSENSORS PPP-EFM AFM tip was used in the research for this paper.

Nature Comm: GMode makes piezoresponse force microscopy 1000 times faster.

Suhas Somnath,, Alex Belianinov, Sergei V. Kalinin, Stephen Jesse, Rapid mapping of polarization switching through complete information acquisition, Nature Communications (2016), 7, 13290, 2041-1723, DOI: 10.1038/ncomms13290

Congratulations to the authors!
Rapid mapping of polarization switching through complete information acquisition
Rapid mapping of polarization switching through
complete information acquisition

 

视频介绍 – 铂硅原子力显微镜探针 – NANOSENSORS™ –

视频介绍 – 铂硅原子力显微镜探针 – NANOSENSORS™ –

在 Youtube

和在  Youku

http://v.youku.com/v_show/id_XNjkzNzU3ODky.html?from=y1.7-1.2

NANOSENSORS公司的吴烨娴博士在本视频中介绍了铂硅原子力显微镜探针。该种探针结合了优良的导电性,高耐磨性和超小型针尖半径为一体,专为导电或静电AFM成像设计。

与传统的导电型AFM针尖比较,它的质地更加地坚硬。和金刚石涂层的AFM针尖比较,铂硅探针的尖端半径只有1/5甚至1/6(~25纳米),而却有其 10倍的导电系数。而且这种探针的磨损率与硅和其他金属涂覆的探针相比显著降低。此外,硅化铂几乎耐受所有类型的化学药品。

http://www.nanosensors.com/Platinum_Silicide.pdf

此款铂硅AFM针尖可适用于
导电原子力显微镜
隧道原子力显微镜
扫描电容显微镜
开尔文探针力显微镜 和
静电力显微镜

需要注意的时,由于此类铂硅针尖的尖端有很高的长径比和很小的曲率半径,此类针尖不适用于表面受力很大的扫描扩展电阻显微镜

Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available

NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

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