Tag Archives: Atomic Force Microscopy

Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark

The screencast held by Head of R&D Thomas Sulzbach  on the  NANOSENSORS PointProbe® Plus Silicon AFM probe series  with a consistent tip shape leading to more reproducible results has just passed the 500 views mark.
Congratulations Thomas!

Screencasts on the PointProbe® Plus are also available in Japanese

and in Chinese:

also on youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html

Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 500 views mark

The screencast on the soft, drift-reduced NANOSENSORS uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 500 views mark.
Congratulations Dr. Aeschimann!

This screencast is also available in Japanese:

and in Chinese:

The Chinese version is also available on Youku: http://v.youku.com/v_show/id_XNzA4MTgxNTI4.html
or weibo http://weibo.com/u/5077581192?is_all=1

 

Why you shouldn’t just pick a cantilever that is “lying around”

Have a look at this useful blog article Why you shouldn’t just pick a cantilever that is lying around on Microscopy and Analysis explaining why it matters to choose the right cantilever and what to look out for.

SEM image of an uniqprobe cantilever.
SEM image of  a NANOSENSORS uniqprobe cantilever – soft, low drift cantilever for biology and life science applications