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Who said that AFM probes can only be used for Atomic Force Microscopy?
In the article “Resonant torsion magnetometry in anisotropic quantum materials” which just appeared in Nature Communications, K. A. Modic, Maja D. Bachmann, B. J. Ramshaw, F. Arnold, K. R. Shirer, Amelia Estry, J. B. Betts, Nirmal J. Ghimire, E. D. Bauer, Marcus Schmidt, Michael Baenitz, E. Svanidze, Ross D. McDonald, Arkady Shekhter and Philip J. W. Moll use the NANOSENSORS™ Akiyama-probe for resonant torsion magnetometry.
There are three advantages why it makes sense to divert the NANOSENSORS™ Akiyama-probe from it’s orginal intended use and use it for resonant torque magnetometry instead:
1. the relatively large spring constant of the silicon cantilever allows the authors to extend ultrasensitive and dynamic cantilever magnetometry to macroscopic sample sizes
3. the electrical read-out of the A-probe eliminates the need for optical detection of the resonant frequency, thus making setup relatively straightforward and more robust compared to previous approaches.”*
*K. A. Modic, Maja D. Bachmann, B. J. Ramshaw, F. Arnold, K. R. Shirer, Amelia Estry, J. B. Betts, Nirmal J. Ghimire, E. D. Bauer, Marcus Schmidt, Michael Baenitz, E. Svanidze, Ross D. McDonald, Arkady Shekhter; Philip J. W. Moll
Resonant torsion magnetometry in anisotropic quantum materials
Nature Communications, volume 9, Article number: 3975 (2018)
For the full article please follow this external link: https://rdcu.be/7Z0A
Open Access The article “Resonant torsion magnetometry in anisotropic quantum materials” by K.A. Modic et. al is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM) for scanning and studying sample surfaces with magnetic features:
The screencast introducing the different properties of these AFM probes and their applications held by our Head of R&D Thomas Sulzbach has just passed the 1000 views mark. Congratulations Thomas!