Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available

NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

The newly developed AFM tips are made of highly conductive platinum silicide which unites high conductivity (higher than conductive diamond coating and as good as metal coated tips) with a high wear resistance (much higher than metal coated probes and almost as good as diamond coated probes). Additionally the new PtSi probes have a slightly decreased tip radius compared to standard metal coated AFM probes. They can be used for any kind of electric or electrostatic AFM measurement, except SSRM.

Platinum-Silicide-probes-flyer-20111215011213

The Platinum Silicide AFM probes can be used for:

  • TUNA, Tunneling AFM
  • SCM, Scanning Capacitance AFM
  • C-AFM, Conductive AFM
  • EFM, Electrostatic Force Measurements
  • KPFM, Kelvin Probe Force Measurements

The first three basic types PtSi-NCH (for non-contact mode) , PtSi-FM (for force modulation mode) and PtSi-CONT (for contact mode) are now commercially available.

Further types such as AFM probes for specialized applications like SSRM are under development.

For more information please refer to: Platinum Silicide probes brochure, have a look at the NANOSENSORS Screencast on Platinum Silicide AFM Probes or contact us at info@nanoandmore.com.