NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series

NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.

The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

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NANOSENSORS™ introduces self-sensing self-actuating Akiyama-Probe

NANOSENSORS™ today announced the introduction of the Akiyama-probe

Akiyama-probeThe Akiyama-probe has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The product is called the Akiyama-probe or A-probe to honour its inventor Dr. Terunobu Akiyama. It is a novel self-sensing and – actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.

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